Surface Plasmon Interference for Super-Resolution Microscopy

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Solution Overview

Problem

Conventional optical microscopy is limited by diffraction in achieving high-resolution imaging, particularly at nano-scales, and existing techniques for improving resolution, such as structured illumination microscopy, often compromise on imaging speed or introduce sample damage.

Innovation Solution

The integration of tunable surface plasmon interference patterns with structured illumination microscopy enables high-resolution, high-speed imaging by generating interference patterns with sub-wavelength periodicities, using surface plasmons to enhance spatial resolution without nonlinear responses, and employing a digital mirror device for rapid pattern control.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional optical microscopy is used, then imaging speed is maintained, but spatial resolution is limited by diffraction

Engineering Contradiction:
Improvespatial resolutionVSAvoidimaging speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent introduces surface plasmons as an intermediary between light and the sample. Surface plasmons are excited by laser interference patterns and provide sub-wavelength illumination with enhanced spatial frequency content, enabling super-resolution imaging while maintaining high imaging speeds through the plasmonic mediation process

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the physical parameters of illumination by using surface plasmon resonance to generate interference patterns with sub-wavelength periodicities. This parameter change in the illumination wavelength and spatial frequency enables resolution improvement beyond the conventional diffraction limit while maintaining high imaging speed

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If structured illumination microscopy is used, then spatial resolution is improved, but imaging speed deteriorates

Engineering Contradiction:
Improvespatial resolutionVSAvoidimaging speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces the conventional mechanical scanning or sequential illumination approaches with a plasmonic field-based illumination system. Surface plasmons are excited instantaneously across the field of view using laser interference patterns, eliminating mechanical bottlenecks and enabling parallel super-resolution imaging at high speeds

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If non-linear SIM is used, then resolution enhancement is achieved, but sample damage and heating increase

Engineering Contradiction:
Improvespatial resolutionVSAvoidsample heating and damage
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

Surface plasmons act as an intermediary that concentrates optical energy at sub-wavelength scales without requiring high-intensity nonlinear excitation. The plasmonic field enhancement provides the necessary spatial frequency content for super-resolution while distributing energy more efficiently, reducing sample heating and damage compared to direct nonlinear SIM approaches

Inventive Principle:
Principle #24Intermediary (Mediator)

4Measurement precision

If point-by-point scanning is used, then high resolution is achieved, but imaging time increases significantly

Engineering Contradiction:
Improvespatial resolutionVSAvoidimaging time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent uses periodic laser interference patterns to generate surface plasmons that illuminate the entire field of view simultaneously. This periodic illumination approach replaces sequential point-by-point scanning with parallel field-wide illumination, achieving super-resolution without the time penalty of scanning while maintaining high imaging speeds of over 50 frames per second

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach achieves 3-5 fold improvement in spatial resolution and imaging speeds of over 50 frames per second, enabling ultra-fast dynamic imaging with deep sub-diffraction limited resolution for both scattering and fluorescence microscopy.

Implementation Method 1

the illumination of a specimen is provided by interference patterns generated by surface plasmons

Methodology Applied
Scientific EffectSurface plasmon interference: Interference

Implementation Method 2

the field of tunable surface plasmon interference and the field of structured illumination microscopy

Methodology Applied
Scientific EffectSurface plasmon resonance: Resonance

Data Source

PatentUS8836948B2High resolution structured illumination microscopy
Publication Date: 2014.09.16 RGT UNIV OF CALIFORNIA
  • US8836948B2 patent drawing
  • US8836948B2 patent drawing
  • US8836948B2 patent drawing

AI summary

Disclosed are systems, apparatus, methods and devices, including a method that includes generating two or more sequential surface plasmon interference patterns, at least one of the two or more sequential surface plasmon interference patterns being different from another of the two or more sequential surface plasmon interference patterns, and capturing respective images of a specimen resulting from the interference patterns. Also disclosed is a method that includes generating two or more sequential optical interference patterns, at least one of the two or more sequential optical interference patterns being different from another of the interference patterns, and removing from each of the generated interference patterns, using a beam stopper, a corresponding zero-order diffraction light component included in the respective generated patterns to obtain resultant corresponding two or more sequential optical interference patterns, directed at a specimen, with missing respective zero-order light components.