Surface Profiling Using Angular Light Isolation
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Solution Overview
Problem
Current surface profiling techniques for non-plane surfaces, such as free-form objects, are complex, costly, and require high skill levels, making them inaccessible in cost-sensitive fields and difficult to operate without extensive training.
Innovation Solution
A method and device using a predetermined angular distribution of collimated light waves for illuminating an object's surface, isolating and detecting collimated light waves with different angular ranges, and deriving the surface profile from detector signal data, which simplifies the measurement process and reduces the need for complex equipment and skilled operators.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If complex interferometric techniques are used to measure surface profiles of non-plane surfaces, then measurement precision is improved, but device complexity and manufacturing costs increase significantly
Solution Approach 1:
The patent segments the measurement process by dividing the surface into multiple measurement zones and using multiple detectors at different positions. Each detector captures light reflected from specific angular ranges, and the system reconstructs the complete surface profile by combining these segmented measurements. This approach achieves high precision without requiring a single complex interferometric system.
Solution Approach 2:
The patent introduces an intermediary optical element (such as a beam splitter or mirror array) that redirects light from the surface to multiple detectors at different angles. This intermediary component enables the system to capture angular information without requiring complex interferometric optics, thereby reducing device complexity while maintaining measurement precision.
2Measurement precision
If interferometric devices with high precision are used, then measurement accuracy is improved, but the skill level and training effort required increase significantly
Solution Approach 1:
The patent implements self-service through automated data processing and evaluation. The system automatically processes the detector signals, reconstructs the surface profile, and evaluates the quality without requiring manual intervention or specialized expertise. The automated evaluation algorithm objectively assesses surface quality, eliminating the need for highly skilled operators to interpret complex interferometric patterns.
Solution Approach 2:
The patent replaces the mechanical complexity of interferometric alignment and adjustment with electronic signal processing. Instead of requiring precise mechanical alignment and manual adjustment of interferometric components, the system uses electronic detectors and digital signal processing to achieve high measurement accuracy, thereby reducing the skill level required for operation.
3Measurement precision
If conventional surface profiling techniques are used, then measurement capability is maintained, but manufacturing costs increase significantly
Solution Approach 1:
The patent employs standard, readily available optical components such as LEDs, simple detectors, and basic optical elements instead of expensive interferometric equipment. These inexpensive components can be easily manufactured and replaced, significantly reducing the manufacturing cost of the measurement system while maintaining adequate measurement capability for quality control applications.
Solution Approach 2:
The patent changes the measurement parameters by using light at specific wavelengths and detecting reflected light at multiple angles rather than relying on complex interferometric patterns. This parameter change allows the use of simpler, cheaper optical components while achieving the required measurement precision through computational methods rather than expensive hardware.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach facilitates the measurement of surface profiles with moderate operator requirements and lower manufacturing costs, enabling surface profiling in cost-sensitive fields and providing high spatial resolution without the need for expensive optical components.
Implementation Method 1
the illumination light comprises a predetermined angular distribution of collimated light waves
Implementation Method 2
collecting the light waves reflected off the surface with an imaging assembly
Implementation Method 3
detecting the isolated light waves and providing detector signal data for each of the consecutively isolated light waves with a detector
Data Source
Figure 1
Figure 2A~2B
Figure 2C~2D
AI summary
Provided are a method and a device for characterizing a surface (12a) of an object (12). The method comprises illuminating the surface (12a) of the object (12) with a predetermined illumination light, wherein the illumination light comprises a predetermined angular distribution of collimated light waves, and collecting the light waves reflected off the surface (12a) with an imaging assembly (14). The method further comprises consecutively isolating collimated light waves having different angular ranges from the light waves reflected off the surface (12a). In addition, the method comprises detecting the isolated light waves and providing detector signal data for each of the consecutively isolated light waves with a detector (24) arranged at a detecting distance after the imaging assembly (14); and deriving a surface profile of the surface (12a) based on the detector signal data and the respective different angular ranges of the consecutively isolated collimated light waves.