Surface Scan Measuring Device Dynamic Speed Control
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Solution Overview
Problem
Conventional surface scan measuring devices face challenges in adjusting scanning speed and sampling pitch according to the surface condition of workpieces, leading to inadequate measurement time or errors such as excessive push-in and breakaway.
Innovation Solution
A surface scan measuring device with a detecting section, moving section, and measurement data storage that adjusts scanning speed and sampling pitch based on real-time surface condition determination, using a measurement condition deciding section to control the scanning probe's movement and data sampling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the scanning speed is fixed to a low value, then the measurement accuracy is improved, but the measuring time increases unnecessarily
Solution Approach 1:
The patent implements dynamic adjustment of scanning speed based on real-time surface condition detection. The system automatically increases scanning speed on flat surfaces and decreases it on undulated surfaces, transforming the static scanning speed into a dynamic parameter that adapts to local surface characteristics, thereby resolving the contradiction between measurement accuracy and measuring time
Solution Approach 2:
The system changes the scanning speed parameter according to the detected surface undulation conditions. By monitoring surface geometry in real-time and adjusting the scanning speed parameter accordingly, the system optimizes the balance between measurement precision and measurement efficiency for different surface regions
2Loss of time
If the scanning speed is fixed to a high value, then the measuring time is reduced, but errors such as excessive push-in and breakaway occur
Solution Approach 1:
The system dynamically adjusts scanning speed based on real-time surface condition feedback. When undulated surfaces are detected, the scanning speed is automatically reduced to prevent excessive push-in and breakaway errors, while maintaining high speed on flat surfaces. This dynamic control mechanism ensures measurement reliability without sacrificing overall measuring time
Solution Approach 2:
The system employs feedback control by continuously monitoring surface conditions during scanning and using this information to adjust scanning speed. The feedback loop detects surface undulations and automatically modifies scanning parameters to prevent measurement errors, thereby maintaining high measurement reliability
3Device complexity
If data are collected at a fixed sampling pitch, then the data acquisition process is simplified, but the data may be excessive or insufficient depending on surface undulation
Solution Approach 1:
The system implements dynamic adjustment of sampling pitch based on detected surface undulation conditions. The sampling pitch is automatically increased on flat surfaces to reduce data quantity and decreased on undulated surfaces to ensure sufficient measurement data, optimizing the balance between data acquisition simplicity and data sufficiency
Solution Approach 2:
The system applies different sampling pitches to different regions of the workpiece based on local surface characteristics. Flat regions use larger sampling intervals while undulated regions use smaller intervals, ensuring appropriate data density for each local area without requiring complex uniform sampling throughout
Data Source
AI summary
A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the surface condition of a workpiece are provided. The surface scan measuring device includes a radius of curvature computing section (543) for computing the radius of curvature of the scanning point from the measurement data acquired during the ongoing scanning operation, a moving speed deciding section (544) for deciding the moving speed of the scanning probe according to the computed radius of curvature and a sampling pitch deciding section (546) for deciding the sampling pitch according to the computed radius of curvature.