Surface Unevenness Measuring Device for Composite Inspection

The patent replaces manual visual inspection with an automated measuring device that uses electronic sensors (LVDT or resistance-based) to detect surface unevenness. The mechanical probes automatically scan the surface and convert physical displacements into electrical signals, eliminating the need for manual operation while significantly improving detection efficiency and accuracy for small surface undulations.

The measuring device is designed to be self-operating through automated probe scanning and electronic signal generation. The device independently performs measurements without requiring manual intervention, with the probes automatically moving across the surface and electronic sensors continuously monitoring position changes, thereby maintaining simplicity while dramatically increasing productivity.

The patent introduces an intermediary contactless sensing system using LVDT or resistance-based electronic sensors that detect surface unevenness through electrical signals without requiring physical contact materials. The probes with electronic sensors act as intermediaries that transfer surface geometry information to electrical signals, eliminating the need for contaminating coupling materials while maintaining high detection precision for surface wrinkles.

The patent substitutes mechanical contact methods requiring coupling materials with an electronic sensing system. The LVDT or resistance-based sensors detect surface displacements through electrical measurement rather than mechanical contact, eliminating the need for additional materials that would contaminate the surface and compromise the finished product strength.

The patent segments the inspection process into multiple probe points distributed across the surface. Instead of using time-consuming X-ray scanning of the entire structure, the measuring device uses multiple probes that can simultaneously or sequentially measure local surface unevenness at different locations, significantly reducing inspection time while maintaining detection precision for fibre misalignment and wrinkles.

The patent replaces complex and time-consuming X-ray scanning with a simpler electronic probe-based measurement system. The LVDT or resistance-based sensors provide rapid, real-time detection of surface unevenness without requiring the extensive time needed for X-ray image acquisition and analysis, making the inspection process much faster while maintaining adequate detection capability for both surface and deeper misalignment defects.

The patent merges multiple probes with a common frame structure and shared electronic sensing system. Instead of having completely independent measurement systems for each probe, the probes are integrated into a single device with a common frame and electronic circuitry that processes signals from all probes, reducing overall device complexity while maintaining the measurement precision provided by multiple probes.

The electronic sensing means (LVDT or resistance-based) serves multiple functions: it detects the position of each probe, converts mechanical displacements to electrical signals, and provides data for surface characterization. This multi-functional approach reduces device complexity by eliminating the need for separate signal generation and processing systems for each probe, while still achieving high measurement precision through the coordinated action of multiple probes.