Surveying Instrument Scan Patterns for Fast Shape Measurement
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Solution Overview
Problem
Existing surveying instruments using three-dimensional laser scanners face inefficiencies due to high data acquisition and processing demands when increasing scan density for detailed shape measurements, leading to inefficient data processing.
Innovation Solution
A surveying instrument with a distance measuring module, optical axis deflector, projecting direction detector, and arithmetic control module that performs a scan with a predetermined pattern, creating an overlay image and calculating straight or curve lines based on intersections, allowing for efficient data reduction and measurement time optimization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If scan density is increased for detailed shape measurement, then measurement precision is improved, but data processing efficiency deteriorates
Solution Approach 1:
The patent divides the measurement space into a grid pattern with main scans along one direction and sub-scans along the other direction. This segmentation allows the system to focus on specific regions of interest rather than uniformly scanning the entire area at high density, thereby reducing overall data volume while maintaining measurement precision in critical areas through selective dense sampling.
2Measurement precision
If scan density is increased for detailed shape measurement, then measurement precision is improved, but measurement time increases
Solution Approach 1:
The measurement process is segmented into main scans and sub-scans executed in an interleaved manner. The control unit alternates between performing a main scan along the first direction and a sub-scan along the second direction, allowing parallel data acquisition and reducing total measurement time while maintaining precision through the combined grid pattern.
Solution Approach 2:
The patent implements periodic alternating execution of main scans and sub-scans. The control unit periodically switches between scanning along the first direction (main scan) and the second direction (sub-scan), creating a rhythmic measurement pattern that optimizes both speed and coverage, reducing measurement time compared to sequential scanning approaches.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Reduces data acquisition and measurement time by up to 1/30 while maintaining accurate shape measurements, enabling precise calculations of three-dimensional coordinates even for hidden or obstructed areas.
Implementation Method 1
a distance measuring module configured to project a distance measuring light, receive a reflected distance measuring light, and measure a distance to an object
Implementation Method 2
an optical axis deflector configured to deflect the distance measuring light with respect to the reference optical light
Data Source
AI summary
Provided is a surveying instrument including a distance measuring module configured to measure a distance to an object, an optical axis deflector configured to deflect the distance measuring light, a measuring direction image pickup module configured to acquire an observation image, an arithmetic control module, and an operation panel includes a display module, the arithmetic control module is configured to cause the optical axis deflector to perform a scan with a predetermined scan pattern and create an overlay image as a superimposition of the locus of the scan pattern on the observation image, and calculate a formula of a straight line or a curve line based on a measurement result of intersections or the closest points to the intersections between the straight line or the curve line drawn along a ridge line or a contour of the object and the locus of the scan pattern on the displayed overlay image.