Suspend Operation Testing in Flash Memory Systems

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Solution Overview

Problem

Existing memory systems face performance degradation during program and erase operations, as access to flash memory is restricted until these operations are completed, leading to inefficiencies and potential defects in suspend and resume operations.

Innovation Solution

A method is introduced to test and ensure the effectiveness of suspend and resume operations by automatically performing these operations at all designated time points, using a sequence operation circuit to generate and manage internal commands, and a suspend command circuit to control the memory device, thereby detecting defects and optimizing performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If suspend operation is performed during program and erase operations, then memory system accessibility is improved, but reliability of suspend and resume operations deteriorates due to potential defects

Engineering Contradiction:
Improvememory system accessibilityVSAvoidreliability of suspend and resume operations
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent applies preliminary action by performing suspend tests at predetermined time points before actual suspend operations are executed. The sequence operation circuit pre-configures test timing, and the suspend command circuit prepares test commands in advance, allowing potential defects to be detected before they affect normal operations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback mechanisms where the sequence operation circuit monitors whether suspend operations are completed at all predetermined time points, and the suspend command circuit receives feedback about operation completion status. This feedback loop enables continuous verification of suspend/resume functionality and allows the system to adapt to detected defects.

Inventive Principle:
Principle #23Feedback

2Device complexity

If manual testing of suspend operation is performed, then test complexity is reduced, but measurement precision of suspend operation defects deteriorates

Engineering Contradiction:
Improvetest complexityVSAvoiddetection accuracy of suspend operation defects
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies self-service by enabling the memory device to automatically test its own suspend operation functionality. The sequence operation circuit and suspend command circuit work together to autonomously generate test commands, execute suspend operations at predetermined time points, and verify completion without requiring external manual intervention, thereby maintaining low test complexity while achieving high measurement precision.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical testing with an automated electronic testing system. The sequence operation circuit uses electronic signal generation and timing control to automatically execute suspend tests, substituting manual operations with electronic automation, which reduces test complexity while significantly improving the precision of defect detection.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If suspend operation is performed at multiple time points, then reliability of suspend operation testing is improved, but loss of time increases due to multiple suspend and resume cycles

Engineering Contradiction:
Improvereliability of suspend operation testingVSAvoidtime consumed by multiple suspend and resume cycles
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies periodic action by scheduling suspend tests at predetermined time points during ongoing program and erase operations. Instead of continuous or arbitrary suspend-resume cycling, the system performs tests at regular, pre-determined intervals, which maintains comprehensive testing coverage while minimizing the total time lost to testing operations.

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS12039186B2Method of testing a suspend operation
Publication Date: 2024.07.16 SAMSUNG ELECTRONICS CO LTD
  • US12039186B2 patent drawing
  • US12039186B2 patent drawing
  • US12039186B2 patent drawing

AI summary

A method of testing a suspend operation, the method including: determining whether to transfer a suspend sampling signal to a suspend command circuit at a time point prior to each of a plurality of suspend operation time points stored in a sequence operation circuit; transferring the suspend sampling signal from the sequence operation circuit to the suspend command circuit; generating an internal suspend operation command based on the suspend sampling signal; transferring the internal suspend operation command from the suspend command circuit to the sequence operation circuit; performing suspend operations for all the plurality of suspend operation time points in response to the internal suspend operation command; and determining whether the suspend operations are performed at all of the suspend operation time points.