SVM Feature Vector Removal for Face Recognition Accuracy

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Solution Overview

Problem

Conventional face detection and recognition methods, such as SVM, face challenges with low recognition accuracy when the sample set is small due to data overfitting, resulting in high false positives and false negatives.

Innovation Solution

The method involves optimizing the SVM model by selecting and removing feature vectors corresponding to false positives, retraining the model, and adjusting kernel parameters to achieve a higher ratio of sample number to support vector number, thereby increasing recognition accuracy and reducing false negatives.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional SVM methods are used with small sample sets, then the model can be trained quickly, but recognition accuracy is low due to data overfitting and high false positives

Engineering Contradiction:
Improverecognition accuracyVSAvoidfalse positive rate
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent extracts and removes false positive feature vectors from the training set through iterative testing and identification. By systematically identifying and removing FP feature vectors that cause overfitting, the method improves recognition accuracy while maintaining model reliability with small sample sets

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the composition of the training set by dynamically adjusting the feature vector set through iterative removal of false positives. This parameter change in the training data composition allows the SVM model to achieve better generalization with small sample sets, reducing both false positives and improving accuracy

Inventive Principle:
Principle #35Parameter changes

2Loss of information

If more feature vectors are retained in the training set, then more information is preserved, but the ratio of sample number to support vector number decreases leading to overfitting

Engineering Contradiction:
Improveinformation retentionVSAvoidrecognition accuracy
Core Design Contradiction:
Loss of informationVSMeasurement precision

Solution Approach 1:

The patent implements a feedback mechanism through iterative testing where the model performance is continuously evaluated and used to guide the removal of false positive feature vectors. This feedback loop ensures that information is retained only from high-quality feature vectors that improve rather than harm recognition accuracy

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent applies partial action by selectively removing only the false positive feature vectors while retaining the majority of useful feature vectors. This selective approach maintains sufficient information for accurate recognition while preventing overfitting by removing only the harmful excess

Inventive Principle:
Principle #16Partial or excessive action

3Measurement precision

If the sample set size is increased to improve recognition accuracy, then more data is available for training, but the processing time and computational complexity increase significantly

Engineering Contradiction:
Improverecognition accuracyVSAvoidprocessing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent extracts only the essential false positive feature vectors that are causing overfitting, rather than processing or analyzing all feature vectors exhaustively. This selective extraction approach improves accuracy by removing harmful elements while minimizing the computational time required for the optimization process

Inventive Principle:
Principle #2Taking out (Extraction)

Data Source

PatentUS10956713B2High recall additive pattern recognition for image and other applications
Publication Date: 2021.03.23 SHUTTERFLY LLC
  • US10956713B2 patent drawing
  • US10956713B2 patent drawing
  • US10956713B2 patent drawing

AI summary

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the first SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, automatically removing feature vectors corresponding to the FP data set from the feature matrix T by the computer processor to produce a feature matrix T_best, retraining the first SVM model on the feature matrix T_best to produce a second SVM model, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the second SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the second SVM model on the feature matrix T_best.