Sweep-Pulse Ultrasonic Thickness Sensing for Multi-Layer Structures
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Solution Overview
Problem
Conventional acoustic monitoring systems fail to accurately measure thickness changes in thin multi-layered industrial structures due to wavelength limitations, leading to potential structural failures and safety hazards.
Innovation Solution
An ultrasonic system that emits controlled frequency sweep pulses to measure layer thickness and material properties, using a piezoelectric or magnetic solenoid transducer to generate ultrasonic waves with specific frequencies and wavelengths, allowing for accurate detection of layer changes through reflected signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional acoustic monitoring systems are used, then structural failures can be detected, but measurement precision for thin multi-layered structures (less than 600 mm) deteriorates due to wavelength limitations
Solution Approach 1:
The patent changes the frequency parameter of the ultrasonic waves to low frequency ranges (20 Hz to 200 kHz), which corresponds to longer wavelengths. This parameter change enables the waves to penetrate deeper into thick multi-layered structures while maintaining sufficient resolution for thickness measurement, thereby resolving the contradiction between detection reliability and measurement precision for thin structures.
Solution Approach 2:
The system uses a sweep pulse that dynamically changes frequency over time, allowing the ultrasonic waves to cover a range of frequencies. This dynamic approach enables the system to adapt to different layer thicknesses and material properties within the structure, improving both detection reliability and measurement precision across varying conditions.
2Length of stationary object
If low frequency ultrasonic waves are used, then penetration depth into thick multi-layered structures is improved, but wavelength increases which may reduce resolution
Solution Approach 1:
The system employs periodic sweep pulses with specific duration and frequency ranges. By controlling the pulse duration and frequency sweep rate, the system optimizes the balance between penetration depth and resolution. The periodic nature of the pulses allows for time-of-flight measurements that resolve layer thicknesses even with longer wavelengths.
Solution Approach 2:
The dynamic frequency sweep within each pulse allows the system to probe different depth ranges with optimally matched wavelengths. Lower frequencies within the sweep provide deeper penetration, while higher frequencies provide better resolution for shallower layers, effectively resolving the contradiction between penetration depth and resolution.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables non-intrusive, accurate measurement of layer thickness and material properties in multi-layered structures, preventing structural failures and ensuring safety by detecting wear and deterioration early.
Implementation Method 1
using a piezoelectric or magnetic solenoid transducer to generate ultrasonic waves
Implementation Method 2
using a piezoelectric or magnetic solenoid transducer to generate ultrasonic waves
Implementation Method 3
allowing for accurate detection of layer changes through reflected signals
Data Source
AI summary
A system and method for measuring thicknesses of one or more thin layers in a multi-layered industrial structure. One of the layers may comprise a coarse-grained material. The multi-layered structure may be less than 600 mm thick. The method comprises emitting ultrasonic pulses into the multi-layered industrial structure and detecting thickness frequencies of the layers of the structure and comparing against known thickness frequencies. The ultrasonic pulses being a frequency sweep pulse or a broadband frequency sweep pulse uniquely programmed for the multi-layered structure.