SWIR Hyperspectral Imaging for Unknown Material Detection
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Solution Overview
Problem
There is a need for accurate detection of unknown materials, such as chemical, biological, and drug substances, in various settings, including security checkpoints and transportation terminals, using spectroscopic imaging techniques that can effectively analyze materials across a wide range of wavelengths, particularly in the short-wave infrared (SWIR) and extended range SWIR spectra.
Innovation Solution
A system and method utilizing SWIR and extended range SWIR hyperspectral and spectroscopic techniques to analyze unknown samples by collecting interacted photons with tunable filters and detectors, generating test data sets, and comparing them to known samples using chemometric analysis, with the capability to integrate with other sensors and modalities for comprehensive detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If spectroscopic imaging is used to detect unknown materials, then detection accuracy is improved, but device complexity increases
Solution Approach 1:
The system segments the electromagnetic spectrum into multiple wavelength ranges (UV, VIS, NIR, SWIR, MIR) and uses different detector arrays optimized for each range. This allows the complex spectroscopic imaging task to be divided into manageable spectral bands, each handled by specialized detectors, thereby improving detection accuracy while making the overall system more manageable despite the inherent complexity
Solution Approach 2:
The imaging spectrometer is designed to perform multiple spectroscopic techniques (absorption spectroscopy, fluorescence spectroscopy, Raman spectroscopy) using a single integrated platform. The system can analyze samples across multiple wavelength ranges with different detector arrays, providing universal material characterization capabilities without requiring separate specialized devices for each technique
2Adaptability or versatility
If multiple detector types are used to cover wide wavelength range, then spectral analysis capability is improved, but device complexity increases
Solution Approach 1:
The system merges multiple detector types (silicon CCD/CMOS detectors for VIS, InGaAs FPA detectors for NIR/SWIR, and other specialized detectors for MIR) into a single integrated imaging spectrometer platform. This consolidation allows the system to cover a wide spectral range from UV to MIR while managing complexity through unified optical paths and integrated control systems
Solution Approach 2:
The system adds the spectral dimension to conventional imaging by incorporating imaging spectrometers that capture both spatial and spectral information simultaneously. This creates hyperspectral data cubes that provide comprehensive material characterization across multiple wavelength ranges, transforming the system from simple imaging to multi-dimensional spectral analysis
3Area of stationary object
If hyperspectral imaging is used to collect spectra over entire area, then detection coverage is improved, but data processing complexity increases
Solution Approach 1:
The system performs preliminary spectral analysis by comparing collected hyperspectral data against reference spectral libraries before final identification. This preliminary filtering and matching process reduces the complexity of subsequent detailed analysis by pre-identifying potential matches and eliminating non-matching materials, thereby managing the complexity of processing large hyperspectral data sets
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate identification and differentiation of threat and non-threat materials, allowing for effective detection on surfaces and objects associated with individuals, enhancing security screening processes through precise spectral analysis and data comparison.
Implementation Method 1
The interacted photons may be passed through a tunable filter and to a first detector
Implementation Method 2
A second detector, such as a RGB video imaging device, may be used in a scanning mod to scan sample scenes
Data Source
AI summary
A system and method for analyzing unknown materials on surfaces including, but not limited to, chemical materials, biological materials, hazardous materials, drug materials, and non-threat materials using SWIR and/or extended range SWIR hyperspectral and spectroscopic techniques. A system comprising a collection optics, a tunable filter, and a first detector for generating a test data set representative of the unknown sample. A second detector, comprising a visible imaging device, may be configured to operate in a scanning mode to locate areas of interest for further interrogation using SWIR. A method comprising generating a SWIR test data set representative of the unknown sample and analyzing the unknown sample to detect, identify and/or distinguish an unknown material as a known material. This analysis may be achieved by comparing the test data set to a reference data set using at least one chemometric technique.