Switch Control Apparatus for Semiconductor Testing Sequence Patterns
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Solution Overview
Problem
Conventional semiconductor testing apparatuses require complex sequence circuits to control the timing of switch opening and closing, which becomes cumbersome for frequent operations and different testing scenarios, often leading to potential damage to the semiconductor under test.
Innovation Solution
A switch control apparatus with a sequence memory and address control module that retrieves and stores open/close instruction data, allowing switches to open or close based on stored states, simplifying the control process and enabling easy sequence changes without complex logic circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a logic circuit sequence circuit is used to control switch timing, then the switch opening and closing order and timing can be controlled, but the device complexity increases and becomes cumbersome for frequent operations and different testing scenarios
Solution Approach 1:
The patent replaces the complex logic circuit sequence circuit with a sequence memory that stores control data. Instead of using complex hardware logic to determine switch timing, the system copies control instructions from memory, simplifying the hardware while maintaining reliable control of switch opening and closing operations
Solution Approach 2:
The patent substitutes the mechanical/electrical logic circuit system with a memory-based data storage and retrieval system. By replacing the sequence circuit hardware with sequence memory and control data, the system achieves the same timing control function with reduced complexity and improved flexibility for different testing scenarios
2Adaptability or versatility
If an exclusive sequence circuit is prepared for every testing apparatus, then the specific testing requirements can be met, but the device complexity and cost increase
Solution Approach 1:
The patent creates a universal sequence memory system that can serve multiple testing apparatus and scenarios. Instead of preparing separate exclusive sequence circuits for each testing requirement, a single sequence memory stores control data for various testing scenarios, allowing one system to perform multiple functions and adapt to different testing needs
3Adaptability or versatility
If the sequence circuit is made more complex to maintain switch position after testing starts, then the switch control flexibility improves, but the device complexity increases
Solution Approach 1:
The patent uses sequence memory to store and copy control data that includes instructions for maintaining switch positions. Instead of adding complex logic circuits to handle switch position maintenance, the system simply retrieves pre-programmed control data from memory, achieving flexible switch control without increasing hardware complexity
Data Source
AI summary
A switch control apparatus for controlling a switch is provided, the switch control apparatus including: a sequence memory for recording a sequence pattern, which includes open/close instruction data which instruct the switch thereon to open/close; an address control module for sequentially retrieving each of the open/close instruction data of the sequence pattern from the sequence memory; and an open/close state storage module for storing an open/close state instructed by changed open/close instruction data, when the open/close instruction data retrieved by the address control module is changed, wherein the open/close state stored by the open/close state storage module is provided to the switch such that the switch opens or closes in response to the open/close state.