Semiconductor Switch Failure Detection in Series-Parallel Circuits
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Solution Overview
Problem
Existing semiconductor switch element failure detection methods are inadequate for circuits with multiple switch elements connected in series and parallel, as they fail to accurately identify failures in individual elements, leading to potential complete system shutdown due to excessive stress on remaining elements.
Innovation Solution
A power supply control apparatus and semiconductor failure detection method that includes a reference resistance value storing unit, conduction current detection, potential difference detection, voltage drop calculation, and failure identification units to accurately detect semiconductor switch element failures by comparing actual and calculated voltage drops across the circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple semiconductor switch elements are connected in series and parallel to improve reliability and current switching capability, then system reliability and power handling capacity are improved, but failure detection capability deteriorates
Solution Approach 1:
The patent divides the monitoring function into multiple independent detection circuits, each responsible for monitoring a specific semiconductor switch element. This segmentation allows individual failure detection within the parallel-series configuration without requiring complete system shutdown or affecting other elements.
Solution Approach 2:
The patent introduces an intermediary detection circuit that measures voltage drops across each semiconductor switch element to indirectly detect failures. This intermediary measurement approach enables failure detection without directly interfering with the operation of the semiconductor elements themselves.
2Object-affected harmful factors
If diode is connected in series with semiconductor switch element to prevent abnormal current, then circuit protection is improved, but electric power loss and space requirement increase
Solution Approach 1:
The patent uses a semiconductor element equivalent to the semiconductor switch element to protect against reversed polarity voltage, replacing the traditional diode. This copying approach maintains electrical characteristics similar to the original switch element, reducing power loss and space requirements while providing the same protective function.
Solution Approach 2:
The patent changes the protection mechanism from using a diode with fixed reverse polarity blocking characteristics to using a semiconductor element that can be controlled to block or conduct based on operational requirements. This parameter change allows for lower power loss and more flexible protection strategies.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables correct identification of semiconductor switch element failures in circuits with multiple elements connected in series and parallel, reducing the risk of complete system shutdown by preventing excessive stress on remaining elements and allowing for timely maintenance.
Implementation Method 1
a conduction current detection unit that detects a magnitude of a current flowing through entire of the switching circuit
Implementation Method 2
a potential difference detection unit that detects a potential difference between the input and the output of the switching circuit
Implementation Method 3
a voltage drop calculation unit that calculates an assumed voltage drop based on the reference resistance value and the conduction current
Data Source
AI summary
A power supply control apparatus detects a failure of a semiconductor switch element in a switching circuit having semiconductor series circuits each having semiconductor switch elements connected in series with reverse polarities. The power supply control apparatus includes a reference resistance value storing unit storing information on a combined resistance value between an input and an output of the switching circuit, a conduction current detection unit configured to detect a current flowing through the switching circuit, a potential difference detection unit configured to detect an input-output potential difference between the input and the output of the switching circuit, a voltage drop calculation unit configured to calculate an assumed voltage drop, a voltage comparison unit configured to compare the input-output potential difference with the assumed voltage drop, and a failure identification unit configured to identify a failure of the semiconductor switch element.