Switchable Gate Drive Circuit for Faster Power Semiconductor Testing
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Solution Overview
Problem
Existing test devices for power semiconductors require time-consuming configuration changes for dynamic characteristic tests, which hampers efficient testing.
Innovation Solution
A gate drive circuit with a voltage source, resistance setting circuits connected in parallel, and a switching circuit that dynamically connects resistance setting circuits to the voltage source and gate, allowing for efficient changes in gate driving conditions during tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a test device uses attachable/detachable units for configuration changes according to measurement items, then the device can be adapted to different test requirements, but attaching/detaching work is required which increases testing time
Solution Approach 1:
The patent applies the dynamics principle by replacing static attachable/detachable units with dynamic switching circuits that can change configuration electronically during testing. The switching circuit allows resistance setting circuits to be connected or disconnected from the gate drive circuit through electrical switching rather than physical attachment/detachment, enabling rapid configuration changes without mechanical operations.
Solution Approach 2:
The patent substitutes the mechanical system of attachable/detachable units with an electrical switching system. Instead of physically mounting or removing test units to change configuration, the invention uses switching circuits controlled by control signals to electrically connect or disconnect resistance setting circuits, thereby replacing mechanical configuration changes with electrical control.
2Productivity
If multiple resistance setting circuits are connected in parallel with switching capability, then different gate driving conditions can be tested within a single test period, but the circuit complexity increases
Solution Approach 1:
The patent applies the universality principle by designing resistance setting circuits that can serve multiple test purposes through parallel connection and switching. The same resistance setting circuits can be used for different gate driving conditions by selectively connecting them through the switching circuit, allowing one set of circuits to perform multiple functions rather than requiring separate dedicated circuits for each test condition.
Solution Approach 2:
The patent applies segmentation by dividing the gate drive circuit into modular components: voltage source, multiple resistance setting circuits, and switching circuit. This segmentation allows independent design and optimization of each component while enabling flexible reconfiguration through the switching mechanism, managing complexity through modularity.
Data Source
AI summary
A gate drive circuit is used in a dynamic characteristic test on a power semiconductor, the gate drive circuit includes a voltage source configured to change a gate voltage of a gate of the power semiconductor, a plurality of resistance setting circuits connected in parallel with the voltage source and the gate, and a switching circuit connecting at least one resistance setting circuit of the resistance setting circuits to the voltage source and the gate.