Switchable Microscope Illumination System for Confocal and GSDIM Modes
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Solution Overview
Problem
Current microscope illumination systems are limited in their ability to switch between different modes, such as TIRF and GSDIM, requiring complex and rarely used TIRF illumination apparatus, and often necessitate separate systems for confocal and localization microscopy, which can be costly and inefficient for users.
Innovation Solution
A microscope illumination system that allows switching between confocal microscopy and GSDIM illumination modes by using a scanning mirror device, scanning eyepiece, and scanning tube lens for confocal mode, and inserting a focusing lens to focus the beam into the back focal plane of the objective for GSDIM mode, enabling high-intensity localization microscopy without the need for TIRF illumination.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If a TIRF illumination apparatus is used to provide high-power laser illumination for GSDIM, then the illumination intensity is improved, but the device complexity increases and the system becomes less versatile for confocal microscopy
Solution Approach 1:
The patent creates a unified illumination system that can perform both confocal microscopy and GSDIM/localization microscopy functions. By using a single laser source with switchable optical paths, the system eliminates the need for separate TIRF illumination apparatus while maintaining high illumination intensity for GSDIM and proper scanning illumination for confocal mode, thereby reducing device complexity and increasing versatility.
2Reliability
If separate systems are used for confocal and localization microscopy, then each mode can be optimized, but the overall device complexity and cost increase
Solution Approach 1:
The patent merges confocal microscopy and localization microscopy capabilities into a single integrated system. The illumination unit combines a laser source, beam expander, scanning mirrors, and a switchable optical path that can direct light either through the scanning mirrors for confocal mode or through a focusing lens for GSDIM mode. This consolidation maintains optimization for both modes while eliminating the need for separate systems, reducing complexity and cost.
3Illumination intensity
If the laser beam cross section is reduced for GSDIM to increase power density, then the illumination intensity is improved, but the illuminated specimen field area decreases
Solution Approach 1:
The patent implements a dynamic illumination system where the laser beam cross-section can be adjusted based on the operational mode. A beam expander with variable magnification allows the system to expand the beam for confocal microscopy (larger field area) and reduce it for GSDIM mode (higher power density). This dynamic adjustment capability enables the system to optimize both parameters depending on the required application.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient switching between high-resolution confocal microscopy and super-resolution GSDIM imaging, allowing the same lasers to be used for both modes, reducing equipment costs and increasing user flexibility by providing high-intensity localization microscopy without the need for TIRF illumination.
Implementation Method 1
inserting a focusing lens into the illumination beam path, by which the illumination beam is focused into the back focal plane of the microscope objective
Implementation Method 2
a scanning mirror device for deflecting the illumination beam in a plane perpendicular to the optical axis
Implementation Method 3
a microscope objective focusing the illumination beam onto a specimen to be examined
Data Source
AI summary
The present invention relates to a microscope illumination system for switching between a first, confocal and a second, non-confocal microscope illumination mode, the system having an illumination unit that, in order to provide the first illumination mode, includes an illumination source for generating an illumination beam propagating parallel to the optical axis; a scanning mirror for deflecting the illumination beam perpendicular to the optical axis; and a scanning eyepiece and a downstream scanning tube lens for imaging the scanning mirror into the back focal plane of a microscope objective and for expanding the illumination beam, the objective focusing the illumination beam onto a specimen to be examined. In order to provide the second illumination mode, the system has a focusing lens inserted into the path of the illumination beam in such a way that the illumination beam is focused into the back focal plane of the microscope objective.