Switchable Path Test System for Electrical Interconnect Fault Isolation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current test systems face challenges in effectively testing and characterizing electrical assemblies due to the increasing complexity of electronic systems, where the number of interface connections exceeds the number of available test nodes, making it difficult to identify and locate fault points in interposer interface connections and solder joints.
Innovation Solution
A test system with switchable paths that includes a printed circuit board and a package connected via interface connections, where each interface connection is associated with a switching element such as a diode, allowing for targeted testing and characterization by controlling the switches with specific voltage applications to activate or block current flow, thereby increasing the number and accuracy of identifiable fault locations without requiring more test nodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the number of contact pads and interface connections increases to meet increasing electronic system complexity, then the electrical assembly functionality improves, but the number of test nodes available for monitoring does not increase proportionally, making it difficult to test each interface connection
Solution Approach 1:
The patent segments the interface connections into individually controllable groups using switch matrices. Each interface connection can be selectively activated or deactivated through the switch network, allowing test equipment to monitor specific connections without requiring a separate test node for each one. This segmentation enables comprehensive testing of all interface connections while using a limited number of physical test nodes.
Solution Approach 2:
The patent introduces switch matrices as intermediary components between the interface connections and test equipment. These switches act as mediators that route electrical signals from multiple interface connections through a controlled network to a smaller number of test nodes. The intermediary switch structure enables indirect monitoring of all interface connections without requiring direct test node access to each connection.
2Quantity of substance
If multiple interface connections are monitored simultaneously with limited test nodes, then the coverage improves, but the ability to determine specific fault locations deteriorates
Solution Approach 1:
The patent employs dynamic switching control where the switch matrices can be reconfigured in real-time to isolate and monitor specific interface connections individually. By dynamically changing which connections are active through the switch network, the system maintains comprehensive test coverage while enabling precise fault location identification through selective monitoring of individual connections or groups of connections.
Solution Approach 2:
The switch matrix structure segments the monitoring capability into individually controllable channels. Each switch can be independently controlled to activate or deactivate specific interface connections in the test path, allowing the system to divide comprehensive monitoring into discrete, locatable fault segments. This segmentation enables both broad coverage and precise fault identification.
3Device complexity
If traditional test systems are used without switchable paths, then the device complexity is lower, but the granularity of test data points and ability to characterize individual interface connections is insufficient
Solution Approach 1:
The patent introduces switch matrices as intermediary components between the interface connections and test equipment. These switches act as mediators that route electrical signals from multiple interface connections through a controlled network to a smaller number of test nodes. The intermediary switch structure enables indirect monitoring of all interface connections without requiring direct test node access to each connection.
Solution Approach 2:
The patent employs dynamic switching control where the switch matrices can be reconfigured in real-time to isolate and monitor specific interface connections individually. By dynamically changing which connections are active through the switch network, the system maintains comprehensive test coverage while enabling precise fault location identification through selective monitoring of individual connections or groups of connections.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables detailed testing and characterization of individual interface connections, improving the ability to detect and isolate faults in electrical assemblies by allowing for the measurement of each interface connection, thereby enhancing the reliability and robustness assessment of electrical assemblies.
Implementation Method 1
each interface connection is associated with a switching element such as a diode, allowing for targeted testing and characterization by controlling the switches with specific voltage applications to activate or block current flow
Data Source
AI summary
A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.