Switching Interposer Board for Automated IC Test Program Evaluation
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Solution Overview
Problem
Current test program evaluations for integrated circuit devices are time-consuming, requiring technicians to manually short pins and connect probes, often taking around three days to complete, which can lead to inefficiencies and potential damage to the devices during testing.
Innovation Solution
A switching interposer board with a probe point, first and second buses, and a set of switches that selectively couple pins of the integrated circuit device to each other for short tests and to a probe point for voltage level spike tests, significantly reducing testing time by allowing automated and simultaneous evaluation of multiple pins.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual pin shorting and probe connection is used for test program evaluation, then testing can be performed on integrated circuit devices, but the testing process becomes time-consuming and requires approximately three days to complete
Solution Approach 1:
A switching interposer board is introduced as an intermediary device between the integrated circuit device and the test equipment. This interposer board contains multiple switches that can be configured to short pins or connect to probe points, eliminating the need for manual pin manipulation and significantly reducing testing time from three days to a much shorter duration.
Solution Approach 2:
The manual mechanical process of shorting pins and connecting probes is replaced by an automated switching system. The switching interposer board uses electronic switches (such as relay switches or solid-state switches) to automatically configure pin connections according to test requirements, substituting manual mechanical operations with automated electrical switching.
2Reliability
If manual pin shorting and probe connection is used for test program evaluation, then testing can be performed, but the process requires extensive manual operation and technician involvement
Solution Approach 1:
The switching interposer board enables the test system to configure pin connections automatically without requiring manual intervention. The switches on the interposer board can be controlled programmatically to short pins or connect to probe points based on test program requirements, making the system self-configuring and eliminating complex manual operations.
Solution Approach 2:
The switching interposer board serves as an intermediary that automates the connection configuration process. It receives control signals and automatically configures the pin connections through its switches, replacing the need for technicians to manually short pins and connect probes, thereby simplifying the operation significantly.
3Reliability
If manual pin shorting is used during test program evaluation, then short circuit testing can be performed, but potential damage to integrated circuit devices may occur during the testing process
Solution Approach 1:
The switching interposer board acts as a protected intermediary between the test equipment and the integrated circuit device. It provides controlled and reversible pin shorting through its switches, allowing short circuit testing to be performed safely without the risks associated with manual pin manipulation. The automated switching mechanism ensures precise control over when and how pins are shorted, minimizing damage risk.
Data Source
AI summary
One example includes a test system that includes a printed circuit board and a switching interposer board. The switching interposer board is comprised of a probe point, a first bus, a second bus, and a set of switches. Each switch includes a first terminal, a second terminal, and a third terminal, the first terminal being coupled to a respective pin of an integrated circuit device, the second terminal being coupled to the first bus, and the third terminal being coupled to the second bus. Each of the set of switches have a first state that selectively couples a pair of the pins of the integrated circuit device to each other through the first bus during a short test, and a second state that selectively couples at least one of the pins of the integrated circuit device to the probe point through the second bus during a voltage level spike test.