Symmetric Detector Arrangement for Thermal Drift Correction
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Solution Overview
Problem
Automatic analyzers face challenges in maintaining high sensitivity due to drift in light quantity data caused by thermal deformation of the optical system, which is difficult to control and can lead to inaccurate measurements, especially in turntable-type devices where the photometer's shape exacerbates thermal deformations.
Innovation Solution
The solution involves arranging at least a pair of detectors symmetrically across the optical axis to compare light quantity data and calculate the concentration of the measurement target substance, using the averaged or summed values to correct for drift caused by thermal deformation, without increasing the device size or complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high sensitivity detection is implemented by measuring scattered light quantity, then detection sensitivity is improved, but measurement precision deteriorates due to thermal deformation-induced drift
Solution Approach 1:
The detection system is segmented into multiple detectors positioned at different locations (including symmetrically arranged detectors across the optical axis). By dividing the detection function into separate detector units, the system can independently measure light quantities at different positions and use this information to identify and correct thermal deformation effects, thereby maintaining both high sensitivity and measurement accuracy.
Solution Approach 2:
The patent employs asymmetric detector arrangement where detectors are positioned at specific locations including symmetrically across the optical axis. This asymmetric positioning allows the system to detect and compensate for thermal deformation patterns that affect different regions differently, enabling correction of drift while preserving detection sensitivity.
2Reliability
If thermal deformation control is implemented through complex temperature control systems, then measurement accuracy is improved, but device complexity increases
Solution Approach 1:
The system uses its own detection components (multiple detectors including symmetrically arranged ones) to automatically detect and correct thermal deformation effects. The detectors measure light quantity variations caused by thermal deformation, and the system processes this information to compensate for the deformation, allowing the system to self-correct without requiring external complex temperature control equipment.
Solution Approach 2:
Instead of using complex mechanical temperature control systems to prevent thermal deformation, the patent substitutes a detection and correction approach where optical detectors measure the effects of thermal deformation and computational methods correct the measurements. This replaces physical temperature control mechanisms with optical detection and data processing.
3Productivity
If the photometer is mounted on a turntable mechanism, then productivity is improved, but thermal deformation effects are exacerbated
Solution Approach 1:
The detection system is divided into multiple detectors positioned at different locations on the turntable mechanism. By segmenting the detection function across multiple detectors that experience thermal deformation differently during rotation, the system can identify and correct for thermal effects while maintaining the high productivity enabled by the turntable configuration.
Solution Approach 2:
The system implements feedback by continuously monitoring light quantity measurements from multiple detectors during turntable rotation and using this information to detect and correct thermal deformation effects. The feedback loop processes measurement data to identify thermal drift patterns and compensates for them, allowing the turntable mechanism to maintain high productivity without suffering from exacerbated thermal deformation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively corrects for thermal deformation-induced light quantity data drift, enhancing the accuracy and stability of measurements and allowing for high-sensitivity detection of measurement target substances without complicating the device.
Implementation Method 1
irradiating a sample or reaction solution of a mixture of the sample and a reagent with light from a light source, measuring transmitted light quantity
Implementation Method 2
measuring the quantity of light transmitted without being scattered by latex agglutinate
Implementation Method 3
The former one is biochemical analysis having test items which are LDH (Lactate Dehydrogenase), ALP (Alkaline Phosphatase), AST (Aspartate Aminotransferase), and others
Implementation Method 4
The latter one is immuno-analysis having tested items which are CRP (C-reactive protein), IgG (Immunoglobulin G), RF (Rheumatoid factor), and others
Implementation Method 5
using a reagent which is obtained by sensitizing (coupling) an antibody onto surfaces of latex particles
Data Source
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AI summary
There is provided an automatic analyzer that can detect a measurement target substance at high sensitivity without increase in a size of the device and complication of the device by correcting variation in light quantity data caused by thermal deformation of an optical system due to temperature variation inside the device. The scattered light from the measurement target substance passes through a light receiving window 43, and is received by a detector 45a for +θ scattered light and a detector 45b for -θ scattered light which are arranged symmetrically to each other across an optical axis at an equal angle or an equal interval in a vertical direction. A light source 40 is fixed by a light-source holder (that is a base member on which the light source is arranged) 46, and the detectors 45a and 45b are arranged on and fixed to a detector holder (that is a base member on which the detectors are arranged) 47. In this manner, drift of the light quantity data caused by the thermal deformation of the optical system can be corrected by comparing values of the light quantity data of the detectors 45a and 45b.