Symmetrical Plural-Coil Plasma Source RF Distribution

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Solution Overview

Problem

As substrate size increases and device geometry shrinks, achieving uniform etch or deposition rates across the entire surface of substrates in plasma processing becomes challenging due to chamber design asymmetries, temperature distribution non-uniformities, and gas distribution control issues in inductively coupled plasma sources.

Innovation Solution

A plasma reactor design featuring first and second coil antennas with RF feed terminals, a conductive feed plate, axial rods, and radial conductive feed rods, along with shielding and impedance matching networks, to optimize RF power distribution and plasma ion density control across the substrate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If inductively coupled plasma sources are used for processing, then plasma generation is achieved, but process uniformity deteriorates due to chamber design asymmetries, temperature distribution non-uniformities and gas distribution control issues

Engineering Contradiction:
Improveprocess uniformityVSAvoidchamber design asymmetries
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies asymmetry by intentionally introducing asymmetrical features into the chamber design, specifically an asymmetrical RF electrode arrangement and asymmetrical gas distribution system. These controlled asymmetries are designed to compensate for the natural symmetrical asymmetries in the chamber, thereby improving overall process uniformity across the substrate surface

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The patent implements local quality by creating region-specific conditions within the chamber. Different zones of the chamber receive tailored RF power distribution and gas flow rates to account for local variations in temperature, plasma density, and process requirements, ensuring uniform processing across the entire substrate area

Inventive Principle:
Principle #3Local quality

2Area of stationary object

If substrate size increases, then processing capacity is improved, but achieving uniform etch or deposition rates across the entire surface becomes more difficult

Engineering Contradiction:
Improvesubstrate sizeVSAvoiduniformity of etch rate distribution
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent applies segmentation by dividing the RF power delivery system into multiple independent zones with separate RF electrodes. Each zone can be independently controlled to optimize plasma density and process parameters for that specific region, enabling uniform processing across large substrate areas by addressing local variations in power distribution and gas flow

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements dynamics by enabling real-time, independent adjustment of RF power levels and gas flow rates to different chamber zones. This dynamic control allows the system to adapt to changing process conditions and substrate positions, maintaining uniformity even as substrate size increases

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances plasma distribution symmetry, allows independent control of plasma density, and maintains process uniformity even with larger substrates, minimizing asymmetrical non-uniformities and skew effects.

Implementation Method 1

plasma is generated by inductive coupling of RF power to process gases inside the chamber

Methodology Applied
Scientific EffectInductive coupling: Electromagnetic Induction

Data Source

PatentUS10811226B2Symmetrical plural-coil plasma source with side RF feeds and RF distribution plates
Publication Date: 2020.10.20 APPLIED MATERIALS INC
  • US10811226B2 patent drawing
  • US10811226B2 patent drawing
  • US10811226B2 patent drawing

AI summary

A plasma reactor has an overhead inductively coupled plasma source with two coil antennas and symmetric and radial RF feeds and cylindrical RF shielding around the symmetric and radial RF feeds. The radial RF feeds are symmetrically fed to the plasma source.