Synchronized Contact Imaging for Shape Measurement Waveform Analysis

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Solution Overview

Problem

Existing surface shape measurement devices face challenges in distinguishing between abnormal waveforms caused by environmental factors, such as dust, and actual surface features, leading to potential deformation or scratching of the workpiece due to increased measurement force.

Innovation Solution

A shape measurement device that synchronizes displacement detection, position detection, and imaging to associate captured images with displacement data, allowing for synchronized verification of images at specific positions, and includes low-pass filtering and abnormality detection to differentiate between environmental and actual surface abnormalities.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If measurement force is increased to reduce the effect of foreign matter, then measurement reliability is improved, but workpiece deformation or scratching occurs

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidworkpiece deformation or scratching
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary action by capturing images of the contact and workpiece surface at multiple positions before measurement begins. These pre-captured images serve as reference data to identify foreign matter locations in advance, allowing the measurement force to be optimized without causing damage to the workpiece surface.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback by continuously capturing images during the measurement process and comparing them with the displacement detection signals. This real-time feedback mechanism allows identification of abnormal waveforms caused by foreign matter, enabling adjustment of measurement parameters to prevent workpiece deformation while maintaining measurement reliability.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If measurement force is increased to overcome foreign matter interference, then measurement accuracy is improved, but surface quality of workpiece deteriorates

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidsurface quality
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent captures reference images at multiple positions before measurement to identify foreign matter locations in advance. This preliminary action allows the system to adjust measurement parameters to achieve accurate measurements without applying excessive force that would damage the workpiece surface quality.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent uses captured images as an intermediary to understand the relationship between displacement signals and actual surface conditions. By analyzing images showing the contact position and surface state, the system can distinguish between true surface features and foreign matter interference, enabling accurate measurements without compromising surface quality.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Difficulty of detecting and measuring

If synchronization of multiple detection actions is implemented, then ability to identify abnormal waveform causes is improved, but device complexity increases

Engineering Contradiction:
Improveability to identify abnormal waveform causesVSAvoiddevice complexity
Core Design Contradiction:
Difficulty of detecting and measuringVSDevice complexity

Solution Approach 1:

The patent merges the functions of displacement detection, position detection, and imaging by synchronizing their operations through a unified control system. The synchronization controller coordinates these multiple detection actions to capture corresponding data at the same moment, enabling comprehensive analysis of abnormal waveforms while managing device complexity through integrated control.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent uses feedback from synchronized detection to identify the causes of abnormal waveforms. By continuously monitoring displacement signals and corresponding images, the system can determine whether abnormalities are caused by foreign matter or actual surface features, improving detection capability while the feedback mechanism helps manage system complexity through automated analysis.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS12373974B2Shape measurement device and method for controlling same
Publication Date: 2025.07.29 TOKYO SEIMITSU CO LTD
  • US12373974B2 patent drawing
  • US12373974B2 patent drawing
  • US12373974B2 patent drawing

AI summary

A shape measurement device includes: a displacement detector configured to detect displacement of a contact; a relative movement mechanism configured to relatively move the displacement detector with respect to the measurement object, and allow the contact to trace a surface to be measured of the measurement object; a position detecting sensor configured to detect a relative position of the displacement detector with respect to the measurement object; a camera configured to image the contact, and output a captured image of the contact; and a synchronization controller configured to repetitively execute three actions in synchronization together while the relative movement is being performed by the relative movement mechanism, the actions including detection of the relative position by the position detecting sensor, detection of the displacement by the displacement detector, and imaging by the camera.