T-Shaped Single Diffusion Barrier via Single-Mask Process

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current T-shaped single diffusion break (SDB) designs for fin-type field effect transistor (FinFET) devices face defects due to leakage paths and require costly additional masks and process steps, particularly with the use of shallow trench isolation (STI) layers and multiple masks in the process flow.

Innovation Solution

A single-mask process flow is implemented to form a T-shaped SDB, involving the creation of silicon substrate regions, hard mask layers, recesses, spacers, and oxide filling to form a T-shaped STI region, with specific etching and masking steps using reticles and negative tone developers to reduce complexity and cost.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a standard STI layer is used at the same height as other structure locations, then the process is simple, but leakage paths occur between fins causing defects

Engineering Contradiction:
Improveprocess simplicityVSAvoidleakage prevention
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent applies local quality by creating a T-shaped SDB structure with different heights and shapes at specific locations between fins, while maintaining standard STI at other locations. The T-shaped SDB extends deeper into the substrate locally to block leakage paths, while the rest of the STI structure remains uniform and simple to manufacture.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If two masks are used to form a T-shaped SDB with higher oxide STI under the SDB, then the SDB structure is achieved, but the process cost increases

Engineering Contradiction:
ImproveSDB structure formationVSAvoidprocess steps
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent merges the formation of the T-shaped SDB structure into a single etching process step. By using a specifically designed mask pattern and etching conditions, the complex T-shaped structure is created in one step rather than requiring separate deposition and etching steps with multiple masks, thereby reducing process complexity while maintaining manufacturing precision.

Inventive Principle:
Principle #5Merging (Combining)

3Manufacturing precision

If additional oxide deposition and etch process steps are used, then the T-shaped SDB is formed, but the process flow becomes costly and complex

Engineering Contradiction:
ImproveT-shaped SDB formationVSAvoidprocess efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent uses preliminary action by forming a mandrel structure before the final SDB formation. This mandrel serves as a template that guides the single etching step to create the precise T-shaped profile. The preliminary mandrel formation simplifies the subsequent etching process, eliminating the need for multiple deposition and etching steps, thereby improving productivity while maintaining manufacturing precision.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces defects and costs by simplifying the process flow to a single-mask method, enhancing the formation of T-shaped SDBs while maintaining high aspect ratio and precision in FinFET devices.

Implementation Method 1

forming a recess in the silicon substrate through the opening

Methodology Applied
Scientific EffectEtching:

Implementation Method 2

filling the trench and the recess with an oxide layer, forming a T-shaped third STI region

Methodology Applied
Scientific EffectDeposition: Deposition (physical)

Implementation Method 3

removing the spacers; removing the first hard mask layer

Methodology Applied
Scientific EffectEtching:

Data Source

PatentUS9123773B1T-shaped single diffusion barrier with single mask approach process flow
Publication Date: 2015.09.01 GLOBALFOUNDRIES US INC
  • US9123773B1 patent drawing
  • US9123773B1 patent drawing
  • US9123773B1 patent drawing

AI summary

Methods of forming a T-shaped SBD using a single-mask process flow are disclosed. Embodiments include providing a substrate having STI regions; forming a hard mask layer over the substrate and the STI regions, the hard mask having an opening laterally separated from the STI regions; forming a recess in the substrate through the opening, the recess having a first width; forming spacers on sidewalls of the recess, with a gap therebetween; forming a trench in the substrate through the gap, the trench having a second width less than the first; removing the spacers; removing the hard mask layer; filling the trench and the recess with an oxide layer, forming a T-shaped STI region; forming another hard mask layer on a portion of the T-shaped STI region; and revealing a Fin by removing portions of the STI regions and the T-shaped STI region.