Multi-Position T1 Test Adaptor for Simultaneous Jack Engagement
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Solution Overview
Problem
The testing of T1 boards is tedious and time-consuming due to the need for multiple physical connections and insertions/removals of turnaround plugs, which does not enhance productivity or speed up the process.
Innovation Solution
A test adaptor with multiple RJ45 turnaround plugs aligned to match the jack receptacles of a T1 board, allowing simultaneous engagement and disengagement, reducing the number of insertions and removals required for testing multiple T1 boards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a turnaround plug is inserted into each jack receptacle to test T1 lines, then hardware problems can be diagnosed accurately, but the testing process becomes tedious and time-consuming
Solution Approach 1:
The patent combines multiple individual turnaround plugs into a single multi-position test adaptor that can simultaneously connect to and test multiple jack receptacles on a T1 board. This merging of testing functions into one unified device allows all channels to be tested at once, dramatically reducing the time required while maintaining the same diagnostic accuracy as individual plug testing.
Solution Approach 2:
The test adaptor is designed with multiple independent testing positions (e.g., five positions for five T1 lines per board) that can be selectively engaged. Each position corresponds to a specific jack receptacle and can be independently tested, allowing the system to maintain precise individual channel diagnostics while enabling simultaneous multi-channel testing through a single device.
2Reliability
If multiple turnaround plugs are inserted and removed for each T1 board in a chassis, then all channels can be tested, but the process becomes tedious and reduces productivity
Solution Approach 1:
The test adaptor integrates multiple turnaround plug functions into a single device that can simultaneously test all T1 lines on a board. By inserting one adaptor instead of multiple plugs, the system maintains complete channel testing coverage while dramatically improving productivity—testing seven boards requires only seven adaptor insertions instead of thirty-five individual plug insertions.
Solution Approach 2:
The test adaptor is designed as a universal testing device that can interface with multiple jack receptacles simultaneously, making it applicable to all T1 lines on a board. This multi-functional design allows a single device to perform the work of multiple individual plugs, enabling comprehensive testing without repetitive manual operations.
3Measurement precision
If individual turnaround plugs are used for each jack receptacle, then continuous physical connection testing can be performed, but the complexity of the testing process increases
Solution Approach 1:
The patent merges multiple individual testing operations into a single integrated test adaptor device. This consolidation reduces the complexity of the testing process by eliminating the need to repeatedly insert and remove multiple plugs, while maintaining the same continuity testing accuracy through preserved physical connection paths for each channel.
Data Source
AI summary
A test adaptor for performing turnaround testing on a T1 board that has a plurality of jack receptacles disposed therein. The test adaptor is comprised of a bracket, a plurality of openings, and a plurality of test plugs. The bracket has a length and a width complimentary to the length and the width of an end of a T1 board. The plurality of openings disposed in the bracket are spaced apart from each other by predetermined distances that are complimentary to the spacing between the plurality of jack receptacles disposed in the T1 board. The plurality of test plugs are mounted within the plurality of openings in the bracket such that the plurality of test plugs can be engaged with the plurality of jack receptacles substantially simultaneously and with a single mechanical step.