Integrated Tactile-Optical Probe for Deep Feature Measurement
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Solution Overview
Problem
Existing coordinate measuring machines face limitations in measuring objects with complex geometries and deep features, as they often require either tactile probing, which is mechanical and invasive, or optical probing, which struggles with accuracy in the Z-component measurement and cannot access all features, such as deep bores.
Innovation Solution
A probe system combining tactile and optical measurement capabilities, featuring a tactile sensor with a probe element and a microscope camera integrated within, allowing for both mechanical interaction and non-contact imaging, enabling precise measurement of objects with complex geometries and deep features.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If tactile probing is used to measure deep bores and complex geometries, then measurement accessibility is improved, but measurement precision of surface features deteriorates
Solution Approach 1:
The patent combines tactile sensor and optical sensor into a single probe head, allowing simultaneous mechanical probing for deep features and optical imaging for surface features, thus resolving the contradiction between accessibility and precision
Solution Approach 2:
The integrated probe head serves multiple functions: tactile measurement for deep bores and optical measurement for surface features, enabling a single device to handle diverse measurement requirements without compromising either accessibility or precision
2Ease of operation
If optical probing is used to measure surface features and prints, then non-contact measurement is achieved, but Z-component accuracy deteriorates
Solution Approach 1:
The patent merges optical sensor for non-contact surface measurement with tactile sensor for accurate Z-component measurement, allowing the system to leverage the advantages of both methods simultaneously
3Adaptability or versatility
If separate tactile and optical measuring devices are used, then measurement capabilities are expanded, but device complexity increases
Solution Approach 1:
The patent integrates tactile sensor, optical sensor, and their processing units into a single coordinated probe head system, expanding measurement capabilities while avoiding the complexity of managing separate devices through unified control architecture
Solution Approach 2:
The probe head is designed as a universal measuring device that can perform both tactile and optical measurements, eliminating the need for multiple specialized devices and simplifying the overall system configuration
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system enhances measurement flexibility and accuracy by allowing simultaneous tactile and optical probing, overcoming the limitations of traditional methods, particularly in measuring objects with small radii, sharp edges, and deep bores, while eliminating the need for complex focusing and providing precise Z-component determination.
Implementation Method 1
the microscope camera has at least one microscope optical unit which is configured to focus the illumination light beam in the probing point and produce at least one magnified image of the measurement object
Data Source
AI summary
A probe system for measuring a measurement object in optical and tactile fashion is provided which includes a tactile sensor. The tactile sensor includes a tactile probe element. The tactile probe element has a sensor surface and is configured to probe the measurement object in a tactile fashion at at least one probing point on the sensor surface. The probe system further includes a microscope camera which includes an illumination device configured to produce an illumination light beam. The microscope camera further includes a microscope optical unit configured to focus the illumination light beam in the probing point and to produce a magnified image of the measurement object in an image plane. The microscope camera also includes an image capture device configured to record the magnified image and is at least partly arranged in the tactile probe element.