Tag-Based Test Condition Selection for Facility Loop Tests

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Solution Overview

Problem

Manual setting of test signal patterns for facility devices during loop tests is time-consuming and error-prone, requiring significant operator effort and increasing the risk of pattern setting errors.

Innovation Solution

A test condition determination device that uses tag information associated with each item of data to automatically determine and set test signal patterns, reducing operator intervention by utilizing a database to match tag information from facility devices with pre-defined test signal patterns.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual setting of test signal patterns is performed, then flexibility in selecting patterns is maintained, but time consumption and error risk increase significantly

Engineering Contradiction:
Improvepattern setting accuracyVSAvoidsetting time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The test condition determination device automatically acquires tag information from the facility device and determines appropriate test signal patterns without operator intervention. The system serves itself by matching tag information with stored test conditions in the database, eliminating manual setting operations and their associated errors and time consumption.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

Tag information acts as an intermediary between the facility device and the test signal pattern selection. The control unit uses tag information to query the database and retrieve appropriate test conditions, automating the pattern selection process while maintaining accuracy through structured data matching.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If automated determination using tag information is implemented, then setting time is reduced, but system complexity increases due to database requirements

Engineering Contradiction:
Improvetest setup efficiencyVSAvoidsystem structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

Test conditions and signal patterns are pre-prepared and stored in the database with associated tag information before actual testing. This preliminary organization of test data enables rapid automated retrieval during execution, improving productivity while keeping the added complexity manageable through structured preprocessing.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The database structure serves multiple functions: storing test conditions, mapping tag information to patterns, and enabling automated retrieval. This multi-functionality consolidates what would otherwise require separate systems into a unified solution, balancing productivity gains with acceptable complexity levels.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20240385581A1Test condition determination device
Publication Date: 2024.11.21 DAIKIN INDUSTRIES LTD
  • US20240385581A1 patent drawing
  • US20240385581A1 patent drawing
  • US20240385581A1 patent drawing

AI summary

A test condition determination device determines a test condition for a facility device. The facility device is assigned with tag information for each item of data. The test condition determination device includes a control unit, and a storage unit that stores a database in which the tag information and the test condition are associated with each other. The control unit acquires the tag information from the facility device, and determines the test condition from the acquired tag information and the database.