Tagged Serial Test Data Capture for Real-Time ATE Decisions
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Solution Overview
Problem
Existing semiconductor Automatic Test Equipment (ATE) systems require extensive software post-processing to interpret test results due to bulk data capture, making real-time data interpretation and decision-making during testing inefficient.
Innovation Solution
Implementing Serial Capture Streaming (SCS) with pattern syntax to tag serial bits of interest, allowing metadata and tagged data to be forwarded for real-time decisions, such as thermal control, during the test process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If bulk data capture is used during integrated circuit testing, then all test data is captured, but extensive software post-processing is required making real-time data interpretation inefficient
Solution Approach 1:
The patent extracts only the necessary test data bits from the bulk serial data stream using a data selector. Instead of capturing all serial test data and processing it afterward, the system identifies and extracts only the relevant bits during the testing phase, eliminating the need for extensive post-processing software while maintaining complete capture of necessary information.
Solution Approach 2:
The patent performs data selection and extraction during the testing phase itself rather than afterward. The data selector is configured to identify and capture specific bits of interest in real-time as serial data flows through the system, allowing immediate availability of processed data without requiring subsequent software intervention.
2Reliability
If all serial test data is captured during testing, then complete data is obtained, but real-time data interpretation and decision-making becomes inefficient
Solution Approach 1:
The system extracts only the essential test data bits needed for accurate test results while discarding unnecessary data during the testing process. This extraction approach maintains the reliability of test outcomes by capturing all necessary information while dramatically improving real-time processing efficiency by eliminating redundant data handling.
Solution Approach 2:
Instead of processing all serial data bits, the patent applies partial action by selecting and processing only the specific portion of data bits that are necessary for test evaluation. The data selector is configured to capture exactly the required amount of information without the excessive processing of unnecessary data, optimizing both accuracy and efficiency.
3Manufacturing precision
If extensive data is captured for testing, then comprehensive test coverage is achieved, but processing time increases reducing overall testing efficiency
Solution Approach 1:
The patent extracts precisely the data bits required for comprehensive test coverage from the serial data stream. The data selector identifies and captures only the essential bits needed for complete test evaluation, achieving full manufacturing precision in test coverage while minimizing processing time by eliminating unnecessary data extraction and handling.
Data Source
AI summary
A test pattern syntax allows cycles of interest for a device to be tagged as serial protocol data sources during test of the integrated circuit in semiconductor automatic test equipment (ATE). A test pattern syntax is used to tag serial bits of interest. Metadata (from serial capture control contents) in combination with the tagged serial bits of interest received during the test of the integrated circuit is used to identify data in the tagged serial bits of interest. Data in the with tagged serial bits of interest is sent to other location(s) in the automated test equipment. The data in the tagged serial bits of interest can be used for real time decisions (such as thermal control) or plotted in a Graphical user interface (GUI) during test of the integrated circuit.