TaOX Resistance Variable Element Unipolar Operation

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Solution Overview

Problem

Existing resistance variable elements face challenges with operation stability and reproducibility due to high manufacturing temperatures and require bidirectional current restriction elements, which are complex, and few materials support unipolar operation for cross-point memory arrays.

Innovation Solution

A resistance variable element using a TaOX layer with an amorphous structure, where X is between 1.6 and 2.2, allowing unipolar drive at low temperatures without the need for additional 'forming' steps, and incorporating a rectifier element like a diode to prevent crosstalk in cross-point memory arrays.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If perovskite material is used for resistance variable element, then nonvolatile memory function is achieved, but manufacturing temperature becomes too high (650-850°C) which deteriorates other materials

Engineering Contradiction:
Improvenonvolatile memory functionVSAvoidmanufacturing temperature
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

The invention changes the material composition parameters by using TaOX with specific oxygen content (X=1.5-2.2) instead of perovskite materials, enabling resistance variable operation at low temperatures (room temperature to 200°C) while maintaining nonvolatile memory function

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention uses composite structure combining TaOX resistance variable layer with rectifier element (diode), creating a composite material system that achieves both unipolar operation and crosstalk prevention without high temperature manufacturing

Inventive Principle:
Principle #40Composite materials

2Reliability

If bidirectional current restriction element is added to prevent crosstalk, then memory cell isolation is improved, but device configuration becomes complicated

Engineering Contradiction:
Improvecrosstalk preventionVSAvoidconfiguration complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The invention merges the rectifier element (diode) with the resistance variable element into a single integrated structure, where the diode and variable resistor share common electrodes, simplifying the configuration while effectively preventing crosstalk in cross-point memory arrays

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The rectifier element serves multiple functions: it prevents crosstalk between adjacent memory cells, enables unipolar write operation, and works synergistically with the resistance variable element, reducing the need for additional isolation structures

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of operation

If unipolar drive is implemented for cross-point memory array, then writing operation is simplified, but material selection is limited (only NiO, V2O, ZnO, Nb2O5, TiO2, WO3, CoO, Fe2O3 known)

Engineering Contradiction:
Improvewriting operationVSAvoidmaterial selection
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The invention expands material selection by discovering TaOX (with X=1.5-2.2) as a new material that supports unipolar operation, adding versatility to the limited list of known unipolar materials and enabling simplified write operations in cross-point memory arrays

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables reliable unipolar operation, reduces manufacturing complexity, and improves integration density by allowing binary data storage with stable resistance variations, facilitating the formation of layered memory structures.

Implementation Method 1

an electric resistance between the first electrode and the second electrode is lowered by application of a first voltage pulse having a first voltage between the first electrode and the second electrode, and the electric resistance between the first electrode and the second electrode is increased by application of a second voltage pulse having a second voltage of the same polarity as the first voltage

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS7948789B2Resistance variable element, nonvolatile switching element, and resistance variable memory apparatus
Publication Date: 2011.05.24 PANASONIC SEMICON SOLUTIONS CO LTD
  • US7948789B2 patent drawing
  • US7948789B2 patent drawing
  • US7948789B2 patent drawing

AI summary

A resistance variable element comprises a first electrode (2), a second electrode (4), and a resistance variable layer (3) which is disposed between the first electrode and the second electrode, and electrically connected to the first electrode and the second electrode, wherein the resistance variable layer comprises material including TaOX (1.6≦X≦2.2), an electric resistance between the first electrode and the second electrode is lowered by application of a first voltage pulse having a first voltage between the first electrode and the second electrode, and the electric resistance between the first electrode and the second electrode is increased by application of a second voltage pulse having a second voltage of the same polarity as the first voltage, between the first electrode and the second electrode.