TAP Controller Star Configuration Testing

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Solution Overview

Problem

Testing of complex electronic circuits in a star configuration is challenging due to drive conflicts on shared signal lines, as existing JTAG standards are designed for series configurations and cannot perform shift operations concurrently in a star setup.

Innovation Solution

A method and system that allow TAP controllers in a star configuration to perform capture and update phases concurrently, while sequentially selecting and shifting data from each controller to avoid drive conflicts, using a debug test system to manage the scan operation by employing Scan Selection Directives and unique addresses for each TAP controller.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If TAP controllers are connected in a star configuration for testing, then testing efficiency and accessibility are improved, but drive conflicts occur on shared signal lines during shift operations

Engineering Contradiction:
Improvetesting efficiencyVSAvoiddrive conflicts
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The patent segments the shift operation by sequentially selecting individual TAP controllers to perform shift operations one at a time, while other TAP controllers remain in pause state. This segmentation of the previously concurrent shift operation eliminates drive conflicts on shared signal lines while maintaining the star configuration's testing efficiency benefits.

Inventive Principle:
Principle #1Segmentation

2Speed

If all TAP controllers perform shift operations concurrently in a star configuration, then testing speed is improved, but signal line conflicts arise

Engineering Contradiction:
Improvetesting speedVSAvoidsignal line conflicts
Core Design Contradiction:
SpeedVSObject-generated harmful factors

Solution Approach 1:

The patent implements periodic action by cycling through each TAP controller in sequence, allowing one controller to perform shift operations at a time while others pause. This periodic selection pattern maintains controlled testing speed while preventing simultaneous signal line conflicts that would occur with truly concurrent operations.

Inventive Principle:
Principle #19Periodic action

3Adaptability or versatility

If JTAG testing is performed on devices in a star configuration, then accessibility to multiple devices is improved, but the existing JTAG standard cannot support concurrent shift operations

Engineering Contradiction:
Improvedevice accessibilityVSAvoidcontrol complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent introduces dynamic state management where TAP controllers can transition between pause state and shift state based on selection signals. This dynamic behavior allows the system to adapt the operational mode of each TAP controller individually, enabling star configuration support while managing control complexity through standardized state transitions.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS8543875B2Moving third tap controller from exit2-DR state to pause-DR state
Publication Date: 2013.09.24 TEXAS INSTRUMENTS INC
  • US8543875B2 patent drawing
  • US8543875B2 patent drawing
  • US8543875B2 patent drawing

AI summary

A method implemented to test a plurality of components coupled in a star configuration, each component having a test access port (TAP) controller. The method comprises performing a capture phase of a scan operation on all of the TAP controllers in the star configuration and sequentially selecting one of the TAP controllers at a time to perform a shift state. When all of the TAP controllers have been sequentially selected to perform the shift phase, the method further comprises selecting all of the TAP controllers to perform an update phase.