Tapered Wafer Clamp Ring for Stable Plasma Etching

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Solution Overview

Problem

Thin semiconductor wafers can warp or become non-planar, leading to non-uniform layer thicknesses and etch defects due to horizontal shifting of the wafer clamp ring during plasma treatment processes.

Innovation Solution

The use of a wafer clamp ring with tapered outer support holes reduces horizontal shifting by minimizing tolerance, ensuring stable engagement with the wafer substrate and reducing the likelihood of etch defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Stability of the object's composition

If a wafer clamp ring is used to flatten and hold the semiconductor wafer substrate, then the wafer substrate is stabilized and flattened, but the clamp ring may shift horizontally due to tolerances between parts, leading to etch defects

Engineering Contradiction:
Improvewafer substrate planarityVSAvoidetch uniformity
Core Design Contradiction:
Stability of the object's compositionVSManufacturing precision

Solution Approach 1:

The patent applies curvature by using a spherical ball element within the clamp ring assembly. This ball element interacts with a tapered hole to create a self-centering mechanism that eliminates horizontal shifting while maintaining wafer flatness. The spherical geometry converts linear tolerance issues into rotational degrees of freedom that self-correct positioning errors.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The patent changes the geometric parameters of the clamp ring by introducing a tapered hole with specific angle requirements (e.g., 15-45 degrees). This parameter change transforms the rigid fixed-position clamp into an adjustable self-aligning mechanism that compensates for manufacturing tolerances and prevents horizontal drift during the etching process.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If tolerances between parts are reduced to prevent horizontal shifting, then etch uniformity improves, but manufacturing complexity and cost increase

Engineering Contradiction:
Improveetch uniformityVSAvoidclamp ring structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The spherical ball element serves as a simple yet effective mechanism that replaces complex high-precision machining requirements. Instead of requiring extremely tight tolerances on multiple mating surfaces, the design uses the inherent properties of spherical geometry combined with a tapered hole to achieve self-centering, thereby reducing overall manufacturing complexity.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The ball element acts as an intermediary component between the clamp ring body and the wafer holding mechanism. This mediator absorbs the tolerance accumulation that would otherwise require extremely precise direct mating between multiple parts, simplifying the overall manufacturing requirements while maintaining etch uniformity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The tapered design of the wafer clamp ring effectively minimizes horizontal movement, resulting in improved etch uniformity and reduced defects along the wafer edge, enhancing the precision of plasma treatment processes.

Implementation Method 1

Plasma treatment is used for various applications in the integrated circuit production process, such as cleaning the wafer or for etching

Methodology Applied
Scientific EffectPlasma: Plasma

Data Source

PatentUS20240071803A1Methods and systems for dry etching
Publication Date: 2024.02.29 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240071803A1 patent drawing
  • US20240071803A1 patent drawing
  • US20240071803A1 patent drawing

AI summary

Methods and systems for dry etching are disclosed. The system includes a wafer clamp ring having a central opening through which a substrate may be treated and a plurality of smaller, outer support holes for receiving pins from plunger assemblies. The outer support holes are tapered and change in diameter. The tapered shape reduces horizontal shifting of the wafer clamp ring which can occur as the wafer clamp ring is moved up-and-down during operational use. The reduced shifting increases wafer yield along the edges of the wafer.