Time-to-Digital Converter System for Distance Measurement Error Correction
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Solution Overview
Problem
Semiconductor devices used in time-of-flight methods for distance measurement face challenges in accurately acquiring systematic error information, which affects the precision of distance measurement due to factors like propagation delays in control signal lines.
Innovation Solution
The semiconductor device incorporates a configuration where a control signal line connects multiple time-to-digital converters (TDCs) with a delayed input to each TDC, allowing for the measurement of systematic error by processing the difference in arrival times of control signals, enabling real-time correction and acquisition of systematic error information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If control signals are input to multiple time-to-digital converters simultaneously, then the measurement process is simplified, but systematic error due to propagation delay cannot be acquired
Solution Approach 1:
The patent applies preliminary action by inputting the control signal to the first time-to-digital converter before inputting it to the second time-to-digital converter. This creates a deliberate time difference that enables the system to measure and acquire systematic error information about propagation delays in the control signal lines, while still maintaining a simplified measurement process architecture.
2Adaptability or versatility
If control signal line is extended to connect multiple TDCs, then more TDCs can be controlled, but propagation delay increases causing systematic error
Solution Approach 1:
The patent implements feedback by using the second time-to-digital converter to measure the propagation delay of the control signal relative to the first time-to-digital converter. The measured time difference is then fed back to correct the time measurements from both converters, allowing multiple TDCs to be controlled via an extended control signal line while maintaining measurement precision through systematic error compensation.
3Measurement precision
If time difference between control signal inputs is increased, then systematic error can be measured, but measurement time increases
Solution Approach 1:
The patent applies periodic action by repeatedly inputting the control signal to both time-to-digital converters in an alternating sequence. This allows the system to accumulate multiple time difference measurements over successive periods, improving the precision of systematic error measurement through statistical averaging while minimizing the total time required compared to a single prolonged measurement interval.
Data Source
AI summary
A semiconductor device includes a plurality of time-to-digital converters each including an input terminal, an output terminal, and a control terminal. A control signal line is connected to the control terminal of a first time-to-digital converter among the plurality of time-to-digital converters, the control terminal of a second time-to-digital converter among the plurality of time-to-digital converters, and the input terminal of the first time-to-digital converter. A control signal propagating through the control signal line is input to the control terminal of the second time-to-digital converter at a time later than a time when the control signal is input to the control terminal of the first time-to-digital converter, and is input to the input terminal of the first time-to-digital converter at a time later than the time when the control signal is input to the control terminal of the second time-to-digital converter.