Foreign Matter Detector Using TDI Sensor for Moving Samples
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Solution Overview
Problem
Existing foreign matter detection methods using X-ray irradiation are ineffective for continuously moving samples like flowing powders or liquids, as the sample's movement results in low secondary X-ray detection and increased interference from non-foreign elements, making it difficult to detect specific foreign metal matters without stopping the flow.
Innovation Solution
A foreign matter detector system that includes an X-ray source for irradiating a moving sample with primary X-rays, a parallel two-dimensional slit to emit parallel secondary X-rays, a dispersing element to disperse these X-rays, and a Time Delay Integration (TDI) sensor controlled to match the sample's movement, minimizing interference from non-foreign elements and enhancing detection sensitivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray irradiation is used to detect foreign matters in stationary samples, then detection accuracy is improved, but the method cannot be applied to continuously moving samples without stopping the flow
Solution Approach 1:
The patent applies the Dynamics principle by making the detector system adaptable to moving samples. The TDI sensor dynamically adjusts its charge transfer speed to match the sample conveyor speed, and the parallel slit mechanism dynamically selects X-ray trajectories based on the moving sample's position. This allows accurate detection of foreign matters in continuously moving samples without stopping the production flow, resolving the contradiction between detection accuracy and continuous processing capability.
2Productivity
If the sample moves quickly through the irradiation region, then continuous processing is maintained, but the amount of detected secondary X-rays decreases and sensitivity is insufficient
Solution Approach 1:
The patent implements continuity of useful action by ensuring that the TDI sensor continuously tracks the moving sample through synchronized charge transfer. As the sample moves continuously through the irradiation region, the TDI sensor's charge transfer follows the sample's position, accumulating X-ray signals over time without interrupting the sample flow. This maintains both high processing speed and sufficient detection sensitivity by continuously integrating signals from the moving sample.
Solution Approach 2:
The parallel slit mechanism performs preliminary action by pre-selecting and directing specific trajectories of secondary X-rays toward the detector before they reach it. This preliminary directional selection ensures that only relevant X-ray signals from the moving sample are focused onto the TDI sensor, maximizing signal accumulation efficiency even during rapid continuous processing.
3Productivity
If the sample is not fixed and flows through the irradiation region, then continuous production is maintained, but interference from non-foreign elements increases
Solution Approach 1:
The patent applies local quality by using the parallel slit mechanism to selectively detect X-rays from specific localized regions of the moving sample. The slit system focuses on particular trajectories and spatial positions, allowing the detector to examine only the relevant local areas where foreign matters may be present, rather than being overwhelmed by signals from the entire flowing sample. This improves the signal-to-noise ratio while maintaining continuous production flow.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-sensitivity detection of foreign matters in continuously moving samples by synchronizing the TDI sensor's operation with the sample's movement, reducing interference and improving signal-to-noise ratio, allowing for uninterrupted detection in processes like lithium ion battery production.
Implementation Method 1
an X-ray fluorescence, which is characteristic X-rays emitted from the sample, is detected by an X-ray detector
Implementation Method 2
a parallel two-dimensional slit which includes a plurality of slits arranged in at least a moving direction of the sample and is configured to emit parallel secondary X-rays by extracting a parallel component of secondary X-rays
Implementation Method 3
a dispersing element which is configured to disperse the parallel secondary X-rays to obtain a specific X-ray fluorescence
Implementation Method 4
a Time Delay Integration (TDI) sensor which is configured to receive the X-ray fluorescence
Data Source
AI summary
A foreign matter detector includes an X-ray source which irradiates a sample moving in a constant direction with primary X-rays, a parallel two-dimensional slit which includes a plurality of slits arranged in at least a moving direction of the sample and emits parallel secondary X-rays by extracting a parallel component of secondary X-rays generated from the sample, a dispersing element which disperses the parallel secondary X-rays to obtain a specific X-ray fluorescence, a TDI sensor which receives the X-ray fluorescence, and a control unit which controls the TDI sensor to detect a foreign matter corresponding to the X-ray fluorescence. The control unit integrates a luminance value of the X-ray fluorescence received by the TDI sensor while matching a direction and a speed of charge transfer of the TDI sensor to a direction and a speed of movement of the sample.