TDI Sensor Shielding for X-ray Depth of Field
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Solution Overview
Problem
Conventional TDI sensors for transmission X-ray analysis face challenges in adjusting the number of integration stages, leading to reduced depth of field for thick samples, increased costs due to the need for dedicated circuits and software, and limited flexibility in adjusting stages based on sample thickness and type.
Innovation Solution
A transmission X-ray analyzer with a TDI sensor and shield means that allows physical adjustment of the number of integration stages, using a general-purpose TDI sensor and shield plate to control the number of stages, enabling flexible adjustment and reduced costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of integration stages of the TDI sensor is increased, then the S/N ratio increases and measurement precision improves, but the depth of field decreases and the entire sample cannot be grasped
Solution Approach 1:
The patent makes the number of integration stages dynamically adjustable by introducing shield means that can be positioned at different locations. This allows the system to adapt the number of active integration stages based on the sample thickness, thereby resolving the contradiction between achieving high S/N ratio (requiring more stages) and maintaining sufficient depth of field (requiring fewer stages for thick samples).
2Adaptability or versatility
If the number of integration stages is controlled through electric circuit and arithmetic software, then the number of stages can be adjusted, but dedicated IC and software changes are required leading to increased cost
Solution Approach 1:
The patent extracts the control function from the complex electronic/software system and implements it through a simple mechanical shield means. This physical extraction eliminates the need for dedicated ICs and software changes, allowing the use of general-purpose TDI sensors while still achieving adjustable integration stages, thereby significantly reducing manufacturing costs.
Solution Approach 2:
The shield means serves as a simple, inexpensive mechanical component that replaces complex and expensive dedicated ICs and software systems. This cheap mechanical solution achieves the same functional outcome (controlling integration stages) without requiring costly specialized hardware or software development.
3Adaptability or versatility
If the number of integration stages is set on electric circuit and arithmetic software, then stages can be controlled, but it is difficult for measurer to freely adjust the number of integration stages depending upon sample thickness and kind
Solution Approach 1:
The shield means can be dynamically repositioned along the optical path to selectively block different numbers of integration stages. This mechanical dynamic adjustment allows the measurer to freely adapt the integration stages to various sample thicknesses and types without being constrained by fixed electronic circuit settings or complex software interfaces.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy and wide-range adjustment of integration stages, improving the depth of field for thick samples and reducing costs by using a general-purpose TDI sensor, allowing for flexible stage adjustment without the need for dedicated circuits and software.
Implementation Method 1
the TDI sensor being configured to transfer charge accumulated in one line sensor to an adjacent subsequent line sensor
Implementation Method 2
shield means for shielding a part of the image of light entering the TDI sensor by moving back and forth in the predetermined scanning direction
Implementation Method 3
converting a transmission X-ray output from a sample into fluorescent light through a fluorescent screen or the like
Implementation Method 4
image pickup devices for reading charge generated when an image derived from the transmission X-ray image is subjected to photoelectric conversion
Data Source
AI summary
A transmission X-ray analyzer for detecting a transmission X-ray image of a sample that moves relatively in a predetermined scanning direction includes; a time delay and integration (TDI) sensor including a plurality of stages of line sensors including the plurality of two-dimensionally arranged image pickup devices arranged in a direction perpendicular to the predetermined scanning direction, being configured to transfer charge accumulated in one line sensor to an adjacent subsequent line sensor; a shield unit for shielding a part of the image of light entering the TDI sensor by moving back and forth in the predetermined scanning direction, the shield unit being disposed between the TDI sensor and the sample; and a shield unit position control unit for controlling a position of the shield unit so as to shield a predetermined number of stages of line sensors among the plurality of stages of line sensors.