Time Domain Reflectometry for Non-Invasive RF Device Failure Analysis
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Solution Overview
Problem
Analyzing defective radio frequency devices is complex and time-consuming, requiring clean room environments and specialized equipment, making it difficult to identify faulty components without opening the device.
Innovation Solution
An apparatus and method for performing time domain reflectometry that uses a measurement device connected to the device under test via a conductive RF connection, generating test signals, and analyzing reflections to identify failures by comparing measurement results with pre-stored device patterns, allowing for non-invasive identification of faulty components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional error analysis methods are used to examine defective radio frequency devices, then detailed component analysis can be performed, but the process becomes complex and time-consuming requiring clean room environments and specialized equipment
Solution Approach 1:
The patent extracts the essential measurement function from the complex traditional testing process. By using time domain reflectometry to measure signal reflections at the device input terminal, it extracts failure location information without requiring physical access to internal components, thereby eliminating the need for clean room environments and specialized examination equipment while maintaining diagnostic accuracy
Solution Approach 2:
The patent introduces an intermediary measurement method (time domain reflectometry) that acts as a mediator between the tester and the device under test. By measuring signal reflections at the external terminal rather than directly examining internal components, it provides indirect but accurate failure location information, simplifying the testing process while maintaining diagnostic precision
2Ease of repair
If devices are opened for component examination, then faulty components can be identified, but the process requires extensive shielding and becomes time-consuming
Solution Approach 1:
The patent performs preliminary measurement and analysis on the device in its closed state. By conducting time domain reflectometry measurements before opening the device, it identifies failure locations in advance, allowing technicians to directly replace specific components without unnecessary disassembly steps, thereby reducing service time while maintaining ease of repair
Solution Approach 2:
The device itself provides the measurement signal and reflection data needed for failure identification. The time domain reflectometry method uses the device's own signal transmission characteristics to locate failures, eliminating the need for external disassembly and manual component inspection, thus reducing service time while maintaining diagnostic capability
3Loss of time
If non-invasive measurement methods are used, then service time is reduced, but detailed component analysis becomes difficult
Solution Approach 1:
The patent segments the device into measurable sections by analyzing reflection signals at different time delays. Each reflection corresponds to a specific section or component within the device, allowing failure location to be pinpointed to specific segments without physical disassembly. This segmentation approach maintains detailed diagnostic information while reducing service time through non-invasive measurement
Solution Approach 2:
The patent transitions from spatial inspection (requiring physical access to components) to temporal measurement (analyzing signal reflections over time). By measuring in the time domain rather than physically accessing components in space, it preserves detailed failure location information while enabling non-invasive rapid measurement, thus reducing service time without losing diagnostic detail
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy and reliable analysis of defective devices, reducing service time and costs by identifying faulty positions and components without opening the device, and providing detailed information on failure types and locations.
Implementation Method 1
a measurement device (10), which is configured to execute a time domain reflectometry measurement on the device under test (3)
Data Source
AI summary
A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.