TDR Testing System Defect Simulation
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Solution Overview
Problem
Conventional time domain reflectometry (TDR) testing methods fail to provide sufficient information for correcting defective electronic devices, often requiring multiple testing and correction cycles, increasing verification time and labor costs.
Innovation Solution
A TDR testing system and method that stores test data, allows for the identification and modification of defective portions, and computes modified data to verify compliance with predetermined requirements, enabling efficient simulation and correction of defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional TDR testing methods are used to detect defective portions, then the presence of defects can be determined, but sufficient information for correction operations is not provided and multiple testing cycles are required
Solution Approach 1:
The patent applies preliminary action by pre-calculating and storing corrected test data corresponding to various correction operations before actual testing. When a defect is detected, the system can immediately query the pre-prepared corrected data to predict the outcome of correction operations, eliminating the need for multiple iterative testing cycles and significantly reducing verification time.
2Reliability
If multiple TDR testing and correction operations are performed, then compliance can be achieved, but labor cost increases due to repeated physical modifications
Solution Approach 1:
The patent applies copying by creating virtual copies of corrected test data that represent the expected outcomes of various correction operations. Instead of performing repeated physical corrections and re-testing, the system uses these digital copies to simulate and verify correction effectiveness, thereby reducing manual labor and physical rework while maintaining compliance reliability.
3Measurement precision
If conventional TDR testing is used, then defective portions can be identified, but information helpful for correction operations is not provided
Solution Approach 1:
The patent applies feedback by providing corrected test data as feedback information that shows the expected outcome after correction operations. This feedback loop enables operators to understand whether a detected defect will be resolved by a proposed correction, transforming the testing system from merely detecting defects to actively guiding correction operations with predictive information.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient simulation and correction of defects in electronic devices, reducing the need for multiple testing cycles and lowering labor and time costs by allowing for precise modification and verification of test data.
Implementation Method 1
The time domain reflectometry ('TDR') technique is one well-known testing method that is applied to characterize and locate faults in a conductive path of an electronic device. In this technique, a time domain reflectometer applies an input signal that is transmitted along a conductor in a device under test, and then detects a resulting reflection signal returned from the tested device.
Implementation Method 2
Any impedance discontinuities along the transmission path of the inputted electric pulse signal will create echoes in a reflection signal returned by the tested device 102 and detected at the end terminal 112 of the testing machine 110.
Data Source
AI summary
A time domain reflectometry (“TDR”) testing method that includes storing test data resulted from a TDR test applied on an electronic component, displaying the test data, identifying a distinctive portion of the test data corresponding to a defective location in the electronic component, modifying the distinctive portion of the test data, and computing the modified test data to verify whether a predetermined requirement is satisfied.