Teardrop Conductive Pattern for Fan-Out Package Stress Relief
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Solution Overview
Problem
The reliability of the redistribution circuit structure in integrated fan-out packages, particularly in molding compounds, is a concern due to the need for compactness and increased integration density, which poses challenges in maintaining the integrity and connectivity of conductive pillars and vias within the packaging process.
Innovation Solution
A process flow for fabricating integrated fan-out packages involves forming conductive pillars, a protection layer, and a redistribution circuit structure on a molding compound, with specific conductive patterns and inter-dielectric layers to ensure electrical connectivity and mechanical protection, including teardrop-shaped conductive patterns and routing lines to minimize stress and enhance reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the integration density of electronic components is increased to achieve compactness, then the package size is reduced, but the reliability of the redistribution circuit structure deteriorates
Solution Approach 1:
The patent applies local quality by designing a teardrop-shaped conductive pattern with varying width along its length. The wider end provides enhanced mechanical support and stress distribution where the conductive pattern connects to the conductive pillar, while the narrower end facilitates better electrical connection. This non-uniform local geometry optimizes both mechanical reliability and electrical performance in the constrained space of compact packages.
Solution Approach 2:
The patent implements beforehand cushioning by incorporating a protection layer that extends over the conductive pattern and fills the trench structure. This protection layer is formed prior to subsequent packaging processes, providing advance mechanical support and stress relief to the conductive elements. The extended protection layer acts as a cushion against thermal expansion stresses and mechanical deformation that would otherwise compromise the reliability of the redistribution circuit in compact packages.
2Productivity
If smaller electronic components are integrated into a given area to improve integration density, then more components fit in the area, but the connectivity and integrity of conductive elements become more difficult to maintain
Solution Approach 1:
The teardrop-shaped conductive pattern uses local quality variations to maintain connectivity integrity. The wider portion of the teardrop shape provides increased cross-sectional area for current flow and mechanical strength at critical connection points, while the tapered sections optimize space utilization. This local geometric optimization allows reliable conductive paths even when components are densely packed in smaller areas.
Solution Approach 2:
The patent employs composite material structures by combining the conductive pattern material with the extended protection layer material in a layered composite structure. This composite approach provides both electrical conductivity and mechanical protection, ensuring that conductive elements maintain their integrity and connectivity even under the stress of high integration density packaging.
Data Source
AI summary
A conductive pattern including a teardrop shaped portion, a routing line, and a connection portion is provided. The routing line links to the teardrop shaped portion through the connection portion, and a width of the connection portion decreases along an extending direction from the teardrop shaped portion to the routing line. Furthermore, an integrated fan-out package including the above-mentioned conductive pattern is also provided.


