Telemetry-Based Failure Prediction for Device Lifespan Management

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Solution Overview

Problem

Conventional device management approaches fail to accurately analyze devices and components in relation to localized contexts and environmental factors, leading to inaccurate device failure predictions and unnecessary repair or replacement costs.

Innovation Solution

The use of machine learning techniques to process telemetry data from client devices, predicting device failure and lifespan by incorporating environmental and utilization metrics, and performing automated actions based on the predictions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional device management approaches are used, then device failure predictions are made, but accuracy is poor leading to unnecessary repair or replacement dispatches

Engineering Contradiction:
Improvedevice failure prediction accuracyVSAvoidprediction reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The system segments the prediction task into two distinct machine learning models: a failure prediction model that analyzes telemetry data to predict device failures, and a lifespan prediction model that estimates remaining useful life. This segmentation allows each model to specialize in specific aspects of prediction, improving overall accuracy compared to conventional single-approach methods.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces telemetry data as an intermediary between device operation and failure prediction. By collecting and analyzing intermediate telemetry metrics (performance parameters, environmental conditions, usage patterns), the system creates a detailed picture of device health that bridges the gap between normal operation and failure, enabling more accurate predictions than conventional direct assessment methods.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If conventional approaches ignore localized contexts and environmental factors, then analysis is simpler, but prediction accuracy deteriorates

Engineering Contradiction:
Improvefailure prediction accuracyVSAvoiddata collection and processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The machine learning models are designed to process multiple types of input data universally - telemetry data from various device components, environmental factors (temperature, humidity, air pressure, vibrations), and usage patterns. This multi-functional capability allows the system to comprehensively analyze diverse data sources through a unified prediction framework, improving accuracy without requiring separate analysis systems for each factor.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system implements automated data collection and processing where the device management system itself gathers telemetry data, processes it through machine learning models, and generates predictions without requiring external manual analysis. This self-service approach handles the complexity of multi-factor analysis automatically, making the sophisticated data processing transparent to users while delivering improved prediction accuracy.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If machine learning techniques process telemetry data, then prediction accuracy improves, but computational requirements and data processing complexity increase

Engineering Contradiction:
Improvelifespan estimation accuracyVSAvoidcomputational energy consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by stationary object

Solution Approach 1:

The system applies partial action by processing only the most relevant telemetry data and environmental factors through the machine learning models, rather than analyzing every possible parameter. The machine learning algorithms automatically identify and focus on the most predictive features from the collected data, achieving high accuracy while minimizing unnecessary computational energy consumption.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS11537459B2Automatically predicting device failure using machine learning techniques
Publication Date: 2022.12.27 EMC IP HLDG CO LLC
  • US11537459B2 patent drawing
  • US11537459B2 patent drawing
  • US11537459B2 patent drawing

AI summary

Methods, apparatus, and processor-readable storage media for automatically predicting device failure using machine learning techniques are provided herein. An example computer-implemented method includes obtaining telemetry data from at least one client device; predicting failure of at least a portion of the at least one client device by processing at least a portion of the telemetry data using a first set of one or more machine learning techniques; predicting lifespan information pertaining to at least a portion of the at least one client device by processing the predicted failure and at least a portion of the telemetry data using a second set of one or more machine learning techniques; and performing at least one automated action based at least in part on one or more of the predicted failure and the predicted lifespan information.