Telescope Mirror Segment Step Analysis Device

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

The conventional slit interference method for analyzing the step between mirror segments in telescopes faces challenges in accurately determining the interference fringe position corresponding to zero step and identifying the tilt of each mirror segment, especially due to environmental changes and vibration, which affects measurement accuracy and adjustment.

Innovation Solution

A device with a mask having primary slits and an auxiliary slit is used to generate a diffraction pattern with an intersection point, serving as a criterion for identifying the shift amount of the interference fringe, allowing for accurate determination of the step and tilt between mirror segments by adjusting the peak of the interference fringe to intersect with the diffraction patterns from the primary and auxiliary slits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the conventional slit interference method is used to analyze the step between mirror segments, then the measurement can be performed, but the measurement accuracy is insufficient due to difficulty in accurately determining the interference fringe position corresponding to zero step

Engineering Contradiction:

Improvemeasurement accuracy of step sizeVSAvoiddifficulty in determining interference fringe position

Core Design Contradiction:

Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces an auxiliary slit as an intermediary element that generates a reference diffraction pattern. This reference pattern serves as a mediator to accurately determine the position of the interference fringe corresponding to zero step, thereby resolving the difficulty in precise measurement.

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The auxiliary slit creates a copy of the diffraction pattern that serves as a reference. By comparing the interference fringe position with this reference copy, the system can accurately determine the zero step position and measure step sizes with high precision.

Inventive Principle:

Principle #26Copying

2Measurement precision

If multiple slits are used to create multiple intersection points for accurate measurement, then measurement accuracy improves, but the device complexity increases

Engineering Contradiction:

Improvemeasurement accuracyVSAvoidnumber of slits and intersection points

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement function is segmented between the primary slits (which generate the interference pattern) and the auxiliary slit (which generates the reference diffraction pattern). This segmentation allows accurate measurement while maintaining a relatively simple device structure by clearly dividing the functional roles of different slit elements.

Inventive Principle:

Principle #1Segmentation

3Adaptability or versatility

If the telescope operates in orbit as a space telescope, then astronomical observation capability is achieved, but the measurement technique for mirror segment deviations is not matured

Engineering Contradiction:

Improvespace telescope operation capabilityVSAvoidmaturity of measurement technique

Core Design Contradiction:

Adaptability or versatilityVSReliability

Solution Approach 1:

The telescope system performs self-diagnosis and self-adjustment by using the auxiliary slit to generate reference patterns that enable automatic determination of mirror segment positions and tilts. This self-service capability ensures reliable operation in the space environment where external calibration is difficult.

Inventive Principle:

Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise identification and adjustment of the step and tilt between mirror segments, enhancing measurement accuracy and robustness against environmental changes, while reducing the number of slits and intersection points observed.

Implementation Method 1

a diffraction pattern produced by a slit group comprising an auxiliary slit

Methodology Applied

Scientific EffectDiffraction: Diffraction

Implementation Method 2

an interference fringe in a diffraction pattern

Methodology Applied

Scientific EffectInterference: Interference

Data Source

PatentUS12019231B2Device for analyzing size of step in pair of divided mirrors of telescope

Publication Date: 2024.06.25 JAPAN AEROSPACE EXPLORATION AGENCY

AI summary

Provided is a device for designed for use with a telescope having a primary mirror, such as a reflecting telescope, and to accurately analyzing the size of a step between paired regions of a plurality of mirror segments of the primary mirror. The device designed for use with a telescope whose primary mirror is composed of a plurality of mirror segments, and to analyze the size of a step between paired regions of the plurality of mirror segments comprises: a mask disposed in an optical axis of the primary mirror orthogonally to the optical axis at a given position where a plurality of mirror segment images as respective projected images of the plurality of mirror segments do not overlap each other, wherein a plurality of pairs of primary slits is formed at respective positions in the mirror segment images, wherein each of the primary slits are adjacent to a boundary between the paired regions of the mirror segment images and opposed and parallel to each other with a given spacing therebetween, and wherein at least one reference slit is arranged with respect to each of pairs of the primary slits in the mask, such that it extends at a given angle which is not parallel to each of the pairs of primary slits.