Temperature Sensor Linearization Using Segmented Lookup Tables
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Solution Overview
Problem
Existing temperature sensors in semiconductor devices face challenges in accurately measuring temperature due to second-order errors, which are not effectively compensated for, leading to large chip area usage and excessive power consumption in current linearization circuits.
Innovation Solution
Implementing a linearization circuit that applies first-order error correction operations based on partitioned temperature ranges, reducing the complexity and power consumption while improving accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If second-order error compensation is implemented using traditional linearization circuits, then measurement precision is improved, but device complexity and chip area usage increase
Solution Approach 1:
The temperature range is divided into multiple segments, each with its own lookup table. Instead of using a complex continuous second-order compensation circuit, the patent segments the temperature measurement space and applies piecewise linear approximation through discrete lookup tables, significantly reducing circuit complexity while maintaining measurement precision.
Solution Approach 2:
The patent uses lookup tables that store pre-calculated correction values as a simplified model of the complex second-order error characteristics. Rather than implementing the full mathematical model in hardware, it copies the essential correction information into discrete tables that can be queried efficiently, reducing the complexity of the linearization circuit.
2Measurement precision
If traditional linearization circuits are used for temperature compensation, then measurement precision is improved, but power consumption increases
Solution Approach 1:
By segmenting the temperature range and using discrete lookup tables for each segment, the patent enables selective activation of compensation based on the measured temperature range. This segmentation allows the system to use minimal computational resources for each measurement point, significantly reducing power consumption compared to continuous complex calculations.
Solution Approach 2:
The patent applies partial compensation by using lookup tables that provide sufficient correction for the specific temperature ranges encountered in practice. Rather than implementing full second-order compensation across all possible conditions, it uses targeted partial compensation that achieves adequate precision while consuming less power.
3Measurement precision
If complex linearization operations are performed, then measurement precision is improved, but calculation speed decreases
Solution Approach 1:
The patent segments the temperature measurement space into discrete ranges, each with its own lookup table. This segmentation transforms complex continuous calculations into simple discrete table lookups, dramatically improving calculation speed while maintaining sufficient measurement precision for each segment.
Solution Approach 2:
The patent performs preliminary calculation of correction values and stores them in lookup tables before actual temperature measurements are taken. By pre-computing and storing the compensation data, the system eliminates the need for complex real-time calculations during measurement, significantly improving calculation speed.
Data Source
AI summary
Methods, systems, and devices for temperature sensor linearization techniques are described. A temperature sensor associated with a semiconductor device may include a first circuit and a second circuit. The second circuit may be configured to determine that a first temperature, associated with the semiconductor device and indicated by one or more first bits generated by the first circuit, is within a first temperature range of a total temperature range measurable by the temperature sensor. The second circuit may be configured to generate and output, based on the first temperature being within the first temperature range, one or more second bits indicating a second temperature associated with the semiconductor device. The second circuit may generate the one or more second bits by applying, to the one or more first bits, a first-order operation corresponding to the first temperature range and associated with correcting an error of the first temperature.