Temperature Detection IC with Disabling Circuit for Switching Elements

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Solution Overview

Problem

Conventional temperature detecting apparatuses for semiconductor switching elements require a dummy resistor to prevent false wire breakage detection when a temperature sensing diode is not connected, increasing component count and manufacturing costs.

Innovation Solution

Integration of a disabling circuit within an IC that disables abnormality detection by comparing voltage thresholds, allowing for abnormality detection disablement without a dummy resistor, even when the temperature sensing element is not connected.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a dummy resistor is connected to prevent false wire breakage detection, then reliability of abnormality detection is improved, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improveabnormality detection accuracyVSAvoidcomponent count
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent extracts the dummy resistor from the system by implementing a disabling circuit that selectively disables the abnormality detection function when the temperature sensing element is not connected. This allows the system to achieve reliable operation without the dummy resistor component, reducing device complexity while maintaining detection accuracy when the sensing element is properly installed.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces a dynamic disabling mechanism that changes the state of the abnormality detection circuit based on whether the temperature sensing element is connected. The disabling circuit dynamically switches between enabled and disabled states, allowing the system to adapt its behavior to the presence or absence of the sensing element, thereby eliminating the need for a dummy resistor.

Inventive Principle:
Principle #15Dynamics

2Reliability

If a dummy resistor is connected to prevent false wire breakage detection, then reliability of abnormality detection is improved, but manufacturing cost increases

Engineering Contradiction:
Improveabnormality detection accuracyVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent removes the dummy resistor component from the system by implementing a disabling circuit integrated into the IC. This extraction of the dummy resistor directly reduces component count and manufacturing cost while maintaining reliable abnormality detection through the disabling mechanism that prevents false positives when the temperature sensing element is not connected.

Inventive Principle:
Principle #2Taking out (Extraction)

3Device complexity

If the temperature sensing element is not connected, then device simplicity is improved, but false wire breakage detection occurs

Engineering Contradiction:
Improvecomponent countVSAvoidabnormality detection accuracy
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies preliminary anti-action by implementing a disabling circuit that proactively disables the abnormality detection function before false wire breakage detection can occur. When the temperature sensing element is not connected, the disabling circuit detects this condition and preemptively disables the abnormality detection, preventing false positives while maintaining system simplicity without requiring a dummy resistor.

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables reliable abnormality detection disablement without a dummy resistor, reducing component count and manufacturing costs, while maintaining effective overheating detection in power conversion apparatuses.

Implementation Method 1

a temperature sensing element that outputs voltage responding to the temperature of the object

Methodology Applied
Scientific EffectTemperature-voltage relationship of semiconductor diode:

Data Source

PatentUS8797700B2Apparatus for detecting temperature of switching elements
Publication Date: 2014.08.05 DENSO CORP
  • US8797700B2 patent drawing
  • US8797700B2 patent drawing
  • US8797700B2 patent drawing

AI summary

A temperature detecting apparatus includes an integrated circuit that integrates an overheating detecting circuit, a breakage detecting circuit and a disabling circuit, and an element connection terminal connecting a temperature sensing element. The disabling circuit disables the breakage detecting circuit from detecting a breakage of wire when a voltage at the element connection exceeds a disabling threshold which is set higher than an overheating detection threshold and a breakage detection threshold. A predetermined voltage higher than the disabling threshold is applied to the element connection terminal when the temperature sensing element is not connected to the element connection terminal.