Temperature-Scaled Conductivity Data for Portable Crack Detection
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Solution Overview
Problem
Existing methods for detecting cracks or defects in conductive or semiconductive materials, such as ceramic body plating, are often cumbersome, expensive, and non-portable due to reliance on X-ray scanning technologies, which are not effectively adaptable for field use.
Innovation Solution
A computing device-based system that utilizes a temperature-scaled control data set to determine the presence of cracks or defects in materials by comparing electrical parameter measurements with pre-determined control data sets, accounting for temperature changes and complex conductivity variations across multiple layers, allowing for portable and cost-effective crack detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray scanning or X-ray CT scanning is used to detect cracks or defects in materials, then measurement precision is improved, but device complexity, weight, and cost increase significantly
Solution Approach 1:
The patent replaces complex mechanical X-ray scanning systems with an electrical measurement system that uses electrical contacts and conductivity measurements to detect cracks and defects in conductive materials, eliminating the need for heavy X-ray equipment while maintaining detection capability
Solution Approach 2:
The patent creates an electrical signature copy of the material's conductivity characteristics under known conditions, then compares this copied signature against measurements taken during inspection to detect deviations indicating cracks or defects
2Measurement precision
If X-ray scanning or X-ray CT scanning is used to detect cracks or defects in materials, then measurement precision is improved, but portability deteriorates
Solution Approach 1:
The patent replaces heavy mechanical X-ray scanning equipment with a lightweight electrical measurement system consisting of simple electrical contacts and a measurement device that can be easily transported and deployed in field conditions
3Ease of operation
If traditional control data sets are used without temperature correction, then ease of operation is improved, but measurement precision deteriorates due to temperature-induced conductivity changes
Solution Approach 1:
The patent changes the temperature parameter of the control data set to match the measurement temperature by selecting appropriate control data sets and interpolating between them, thereby eliminating temperature-induced measurement errors without complicating the operational process
Solution Approach 2:
The patent introduces temperature-matched control data sets as an intermediary reference that bridges the gap between measurement conditions and baseline conditions, enabling accurate defect detection while maintaining operational simplicity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of cracks or defects in materials with improved portability and reduced costs compared to X-ray radiography or CT scanning, while maintaining sufficient accuracy for field applications.
Implementation Method 1
the measurement data set includes a plurality of values representative of electrical parameters of the tested material
Implementation Method 2
compensate for effects of temperature on the control data set and the measurement data set, e.g., due to changes of electrical conductivity as a function of temperature
Data Source
AI summary
The disclosure describes techniques for detecting a crack or defect in a material. A computing device may determine whether a tested material includes a crack or other defect based on a temperature-scaled control data set and a measurement data set.