Dual-Bandwidth Terahertz Measurement for Object Dimensions and Defects
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Solution Overview
Problem
Existing terahertz measurement methods for determining dimensional data of plate-shaped or strand-shaped objects, such as pipes, are complex, costly, and require significant bandwidths to resolve small structures, and are challenged by defects and disturbances in the object's geometry.
Innovation Solution
A combined measurement system using a first transmitter with a wide bandwidth and a second transmitter with a narrow bandwidth to measure reflections and delays of terahertz radiation, respectively, allowing for reliable and precise determination of dimensional data with reduced complexity and cost, including detection of defects through phase and amplitude analysis of terahertz radiation signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a wide bandwidth terahertz radiation is used to resolve small structures and determine dimensional data, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent divides the measurement task into two segments: a first measurement system with wide bandwidth for high-precision dimensional data determination, and a second measurement system with narrow bandwidth for defect detection. This segmentation allows each system to be optimized for its specific function, reducing overall complexity while maintaining measurement precision where needed.
Solution Approach 2:
The patent creates a multi-functional measurement system where the first transmitter/receiver handles both dimensional measurement and defect detection, while the second transmitter/receiver supplements defect detection. This universal approach allows the system to perform multiple functions with coordinated subsystems rather than requiring entirely separate systems for each function.
2Adaptability or versatility
If multiple transmitters and receivers are arranged around the object to measure it completely, then measurement coverage is improved, but device complexity and installation space increase
Solution Approach 1:
The patent segments the measurement system into two functional groups arranged around the object: the first measurement system with wide bandwidth components and the second measurement system with narrow bandwidth components. This segmentation allows comprehensive coverage through coordination of fewer, specialized subsystems rather than requiring numerous identical components.
Solution Approach 2:
The patent adds a functional dimension to the spatial arrangement by distributing different types of measurement systems (wide bandwidth vs. narrow bandwidth) around the object. This dimensional differentiation allows the system to achieve comprehensive coverage through functional diversity rather than simply increasing the number of identical components.
3Reliability
If terahertz radiation is emitted at non-perpendicular angles to detect defects, then defect detection capability is improved, but reflections from boundary surfaces interfere with measurements
Solution Approach 1:
The patent segments the defect detection function between two systems: the first measurement system uses non-perpendicular irradiation optimized for defect detection, while the second measurement system provides additional defect detection capability. This segmentation allows the system to tolerate boundary reflections in the first system while the second system provides redundant defect detection.
Solution Approach 2:
The patent accepts that the first measurement system will receive some interference from boundary reflections, treating this as an acceptable trade-off for achieving good defect detection. The system uses signal processing and the supplementary second measurement system to filter out these harmful reflections rather than attempting to completely eliminate them through complex hardware modifications.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient measurement of dimensional changes and defects in objects with lower overall effort, using less complex and cost-effective transmitters and receivers, and reduced installation space, while maintaining high precision and sensitivity.
Implementation Method 1
The emitted radiation signal passes through the object and is reflected at its boundaries
Implementation Method 2
The object manipulates the radiation signal, particularly through reflection, scattering, absorption, and refraction
Implementation Method 3
The object manipulates the radiation signal, particularly through reflection, scattering, absorption, and refraction
Implementation Method 4
The object manipulates the radiation signal, particularly through reflection, scattering, absorption, and refraction
Implementation Method 5
the object delays the terahertz radiation signal due to its higher density compared to propagation in air, so that, with known orientation and refractive index of the material, absolute values of the object's dimensions can be determined by measuring the delay of the radiation signal
Implementation Method 6
irradiating terahertz radiation onto the boundary surfaces of an object to be measured at a non-perpendicular angle, so that reflections emanating from the test object and directed toward a transmitting and receiving unit only occur at defects in the object
Data Source
Figure 1~2
Figure 3
AI summary
The invention relates to a method for determining dimensional data, in particular thickness data, of a plate-shaped object or a strand-shaped object, in particular a tube, comprising the steps: - terahertz radiation is emitted from a first transmitter at at least one time point to at least one location on the surface of the object, - the terahertz radiation emitted from the first transmitter is received by a first receiver after passing through the object at least once, characterized by the further steps: - terahertz radiation with a bandwidth of less than 5% of the carrier frequency of the terahertz radiation is emitted from a second transmitter at several times point in time to the surface of the object and/or to several locations on the surface of the object, - the terahertz radiation emitted from the second transmitter is received by a second receiver after passing through the object at least once.- From the terahertz radiation received by the second transmitter and/or a temporal and/or spatial change in the terahertz radiation received by the second receiver, a dimension of the object is determined, taking into account the terahertz radiation received by the first receiver. The invention also relates to a device for determining dimensional data of a plate- or strand-shaped object.