Terahertz Image Acquisition Device with Overlapping Irradiation Units

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Image capture devices using terahertz waves face challenges in maintaining the number of detectable pixels due to specular reflection, leading to reduced information about the object's shape, especially when imaging the human body, and existing millimeter wave devices suffer from high background noise and restricted output limits.

Innovation Solution

The use of two terahertz wave irradiation units with point light sources arranged to create an overlap region on the object, allowing pseudo scattering waves to be detected by multiple pixels, and a scanning unit to adjust incident angles for improved detection, combined with a reflective optical system to enhance signal reception.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single terahertz wave irradiation device with point light source is used, then the device structure is simple, but the number of detectable pixels is reduced due to specular reflection

Engineering Contradiction:
Improveirradiation device structureVSAvoidpixel detection capability
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The single irradiation device is segmented into multiple irradiation units, each with its own point light source. These units are arranged to illuminate the object from different directions, ensuring that specular reflections are distributed across multiple detection angles, thereby increasing the number of detectable pixels while maintaining reasonable structural complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple irradiation units are merged into a single integrated device structure. The point light sources are positioned to create overlapping irradiation regions on the object, combining their effects to enhance pixel detection capability while sharing common structural components such as the detection unit and support framework.

Inventive Principle:
Principle #5Merging (Combining)

2Measurement precision

If multiple point light sources are arranged to create overlap region, then the number of detectable pixels increases, but the device complexity increases

Engineering Contradiction:
Improvepixel detection capabilityVSAvoidirradiation device structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The multiple point light sources are designed to serve multiple functions simultaneously: they collectively illuminate different regions of the object, create overlapping irradiation zones for enhanced detection, and their reflections are captured by a single multi-pixel detection unit. This multi-functionality reduces the need for separate detection systems for each light source.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The point light sources are arranged in a spatial configuration that creates overlap regions on the object surface. By utilizing spatial dimensionality and angular distribution, the system achieves enhanced pixel detection capability through geometric arrangement rather than through complex temporal or spectral multiplexing.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If millimeter waves are used for imaging, then the device can detect objects, but background noise is high and output is restricted

Engineering Contradiction:
Improveobject detection capabilityVSAvoidbackground noise
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The system changes the fundamental parameter of electromagnetic wave frequency from millimeter wave range to terahertz wave range. This parameter change exploits the unique properties of terahertz waves, which have shorter wavelengths providing higher spatial resolution and better penetration characteristics, while operating in a frequency band with lower background noise and fewer regulatory output restrictions compared to millimeter waves.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration increases the number of pixels that can detect terahertz waves, improving image resolution and enabling more accurate shape determination of objects, while reducing the device size and background noise interference.

Implementation Method 1

beams of terahertz waves from a terahertz wave generation element that is considered as a point light source are enlarged and radiated to an object

Methodology Applied
Scientific EffectElectromagnetic radiation: Electromagnetic Induction

Implementation Method 2

imaging with the terahertz waves is not scattering imaging with scattering of, representatively, visible light but is specular reflection imaging with specular reflection

Methodology Applied
Scientific EffectSpecular reflection: Reflection

Data Source

PatentEP3550287B1Image acquisition device, image acquisition method using same, and irradiation device
Publication Date: 2023.11.08 CANON KK
  • EP3550287B1 patent drawingFigure 1A~1B
  • EP3550287B1 patent drawingFigure 2
  • EP3550287B1 patent drawingFigure 3

AI summary

An image capture device 1001 captures an image by using a terahertz wave and includes a generating unit 112 that includes a plurality of generation elements each of which generates the terahertz wave and rests on a resting plane 117, an irradiation optical system 111 that irradiates an object with the terahertz wave, an imaging optical system 101 that images the terahertz wave that is reflected from the object, and a sensor 102 that includes pixels. The plurality of generation elements include at least a first generation element 113 and a second generation element 114 that have different angles of radiation to the object. There is an overlap region in which a region of radiation of a first terahertz wave 156 from the first generation element to the object overlaps a region of radiation of a second terahertz wave 157 from the second generation element to the object.