Terahertz Wave Imaging Apparatus for Real-Time 3D Surface and Depth Acquisition
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Solution Overview
Problem
Current technologies lack an effective method for acquiring both depth and surface images of samples using terahertz waves without influencing the samples, as they often require moving parts or complex setups that are not efficient for real-time imaging.
Innovation Solution
An apparatus comprising a beam source, beam expander, beam splitter, Michelson interferometer reference arm, beam diffuser, telecentric f-θ lens, beam scanner, and beam detector is used to adjust the depth of the sample and acquire both depth and surface images using terahertz waves, allowing for real-time imaging without moving the sample or apparatus.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a Michelson interferometer is used to adjust depth for acquiring depth images, then depth image acquisition capability is improved, but device complexity increases
Solution Approach 1:
The Michelson interferometer is integrated into the terahertz imaging system to serve multiple functions: it enables both depth image acquisition through optical path adjustment and surface image capture, allowing a single device to perform multiple imaging tasks that would otherwise require separate systems
Solution Approach 2:
The interferometer introduces an optical path length dimension to the imaging system, enabling depth information extraction by varying the reference arm length. This adds a temporal/depth dimension to the spatial imaging, transforming 2D surface imaging into 3D depth-capable imaging
2Productivity
If real-time imaging is achieved without moving parts, then productivity is improved, but device complexity increases due to complex beam path adjustment mechanisms
Solution Approach 1:
The system replaces mechanical scanning methods with optical path adjustment using the Michelson interferometer. Instead of physically moving the sample or detector to capture depth information, the invention uses optical interference and beam splitting to achieve depth imaging, eliminating mechanical moving parts and enabling real-time capture
Solution Approach 2:
The beam splitter and reference arm act as intermediaries that enable depth information extraction without direct mechanical interaction with the sample. The interferometer configuration allows optical paths to be adjusted and combined, mediating between the terahertz source and detector to achieve real-time depth imaging
3Object-affected harmful factors
If terahertz waves are used for imaging, then safety for samples and human bodies is improved, but image acquisition capability is limited compared to ionizing radiation
Solution Approach 1:
The system exploits the unique properties of terahertz waves, including their ability to penetrate non-conductive materials while maintaining non-ionizing safety. By adjusting the frequency and optical path parameters within the terahertz range, the system achieves both safe operation and effective imaging capability for depth and surface structures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the simultaneous acquisition of depth and surface images of samples using terahertz waves, providing a 3D image in real-time without the need for sample or apparatus movement, leveraging the non-ionizing properties of terahertz waves for safe imaging applications.
Implementation Method 1
a beam splitter configured to adjust a direction in which the terahertz wave travels, the beam splitter being located in a position at which terahertz waves transmitted through the beam expander intersect
Implementation Method 2
The Michelson interferometer reference arm may be configured to adjust a depth of the sample from which the terahertz wave is reflected so that a depth image of the sample is acquired
Implementation Method 3
a beam diffuser configured to receive a terahertz wave from the beam splitter that receives a terahertz wave corresponding to the terahertz wave that travels in the adjusted direction and that is reflected from a sample, and configured to output a diffused terahertz wave
Implementation Method 4
a telecentric f-θ lens configured to determine a focal point of the terahertz wave diffused by the beam diffuser
Implementation Method 5
a beam scanner configured to reflect and scan the terahertz wave transmitted through the telecentric f-θ lens
Implementation Method 6
a beam detector configured to detect the terahertz wave reflected by the beam scanner, to acquire an image of the sample
Implementation Method 7
Terahertz waves have both directivity and properties of penetrating non-conductive materials. Unlike X-rays that ionize atoms or molecules of a material, a terahertz wave has energy of about 4 mili-electron volt (4 meV), and has a non-ionizing characteristic for preventing a material from being destroyed
Data Source
AI summary
An image acquisition apparatus including a beam source, a beam expander, a beam splitter, an interferometer reference arm, a sample, a beam diffuser, a telecentric f-θ lens, a beam scanner, and a beam detector uses a terahertz wave to acquire a surface image and a depth image of the sample.