Terahertz Inspection Apparatus with Rotating Lens Array
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Solution Overview
Problem
Conventional terahertz wave inspection methods have poor detection resolution and are inefficient for scanning large areas, consuming significant time and resources.
Innovation Solution
An object inspection apparatus utilizing a terahertz wave supplying unit, a focusing lens with circular grooves, and a rotating plate with multiple focusing lenses arranged in a spiral pattern to focus terahertz waves, enhancing detection resolution and efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional terahertz wave inspection methods are used, then the inspection can be performed, but the detection resolution is poor
Solution Approach 1:
The patent divides the inspection system into multiple segments: terahertz wave supplying unit, focusing lens unit, rotating plate with multiple focusing lenses, and detecting unit. Each segment performs a specific function to collectively improve detection resolution while maintaining inspection reliability
Solution Approach 2:
The focusing lens acts as an intermediary between the terahertz wave supplying unit and the object being inspected. It concentrates the terahertz waves to improve detection resolution without compromising the overall inspection quality
2Productivity
If conventional terahertz wave inspection methods are used, then the inspection can be performed, but it consumes a lot of time
Solution Approach 1:
The patent introduces a rotating plate that dynamically positions multiple focusing lenses according to the terahertz wave path movement. This dynamic adjustment enables rapid scanning of large areas without sacrificing inspection quality, significantly reducing inspection time
Solution Approach 2:
The rotating plate continuously adjusts the position of focusing lenses to match the terahertz wave path movement, ensuring uninterrupted and efficient inspection of large areas without time loss
3Area of stationary object
If conventional terahertz wave inspection methods are used, then the inspection can be performed, but it is difficult to inspect matters with a large area
Solution Approach 1:
The patent adds the dimension of rotation to the inspection system. By rotating the plate with multiple focusing lenses, the system can cover large areas efficiently while maintaining high detection resolution, solving the limitation of conventional static inspection methods
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus achieves improved terahertz wave detection resolution and efficiency, enabling rapid and high-resolution imaging of large areas, suitable for various applications such as food and semiconductor inspection.
Implementation Method 1
a focusing lens located between the terahertz wave supplying unit and the object to be inspected so that the terahertz wave supplied by the terahertz wave supplying unit is focused
Implementation Method 2
a rotating plate having a plate shape and including a plurality of the focusing lenses with different distances from the center thereof, the rotating plate rotating in the circumferential direction so that one of the focusing lenses is located at a path of the terahertz wave according to the path movement of the terahertz wave
Implementation Method 3
a terahertz wave detecting unit for collecting and detecting a terahertz wave incident to the object to be inspected
Data Source
AI summary
An object inspection apparatus includes a terahertz wave supplying unit for generating a terahertz wave and moving a path of the terahertz wave according to time so that the terahertz wave is supplied to an object to be inspected, a focusing lens located between the terahertz wave supplying unit and the object to be inspected to focus the terahertz wave supplied by the terahertz wave supplying unit, a rotating plate having a plate shape and including a plurality of the focusing lenses with different distances from the center thereof, the rotating plate rotating in the circumferential direction so that one of the focusing lenses is located at a path of the terahertz wave according to the path movement of the terahertz wave, and a terahertz wave detecting unit for collecting and detecting a terahertz wave incident to the object to be inspected.