Terahertz Measuring Device Beam Splitter Multi-Axis Coverage
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Solution Overview
Problem
Current terahertz measuring apparatuses require significant effort and cost to measure objects with large swivel angles, especially when using terahertz radiation with optical transmitter and receiver units, and alternative methods like arranging multiple devices around the object are costly.
Innovation Solution
A terahertz measuring apparatus that generates two terahertz detection beams with different optical axes, using a beam splitter or adjustable mirror to cover multiple areas of the object in a single measurement, allowing for simultaneous or successive detection and evaluation of measuring signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If a large swivel angle is used to measure the entire circumference of a pipe, then the measurement coverage is improved, but the measuring effort and device complexity increase
Solution Approach 1:
The single terahertz beam is segmented into multiple detection beams using a beam splitter, allowing simultaneous measurement of multiple areas without increasing the swivel angle or device complexity. The beam splitter divides the incoming beam into several paths that can cover different sections of the pipe circumference.
Solution Approach 2:
Instead of increasing the swivel angle in the angular dimension, the patent uses multiple beams traveling in different spatial dimensions simultaneously. This allows coverage of multiple areas without requiring large rotational movements, thus avoiding increased measuring effort.
2Area of stationary object
If multiple terahertz measuring apparatuses are arranged around a test object, then the measurement coverage is improved, but the device cost increases
Solution Approach 1:
Multiple measuring functions are merged into a single terahertz measuring apparatus by using a beam splitter to create multiple detection beams from one source. This eliminates the need for multiple separate apparatuses, reducing device cost while maintaining comprehensive measurement coverage.
Solution Approach 2:
A single terahertz measuring apparatus is made multi-functional by enabling it to simultaneously perform measurements in multiple directions and areas through the beam splitting mechanism. This universal device replaces what would otherwise require multiple specialized apparatuses.
3Device complexity
If successive measurements are taken with a single beam, then the device complexity is reduced, but the measurement time increases
Solution Approach 1:
The patent uses periodic pulsed terahertz radiation to enable simultaneous measurements with multiple beams. The pulsed nature allows time-resolved detection of reflections from different areas, effectively performing multiple measurements in parallel rather than successively.
Solution Approach 2:
By using multiple detection beams operating simultaneously, the system maintains continuous measurement action across multiple areas rather than interrupting to take successive measurements. This eliminates measurement time loss while keeping the device relatively simple.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the effort and cost required for measurement by enabling a single device to cover multiple areas of the test object, achieving clear separation and evaluation of measuring signals without compromising measurement quality, and can be retrofitted into existing systems.
Implementation Method 1
a beam splitter, for example a semi-permeable mirror, may be provided as a beam separating device for separating the emitted terahertz radiation, for example, partially passing the emitted terahertz beam and partially deflecting the same
Implementation Method 2
the second terahertz beam is reflected by a reflection device so that a longer optical distance is created, for example, with double reflection
Implementation Method 3
objects to be measured respectively made of plastics material, ceramics and, for example, also paper or cardboard, that are permeable for terahertz radiation while having a refraction index materially differing from that of air so that the terahertz radiation is partially reflected upon passing the boundary surface
Data Source
AI summary
The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises:a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation,a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).Hereby, it is provided thata beam splitter (4) is provided to split up the emitted terahertz radiation (10) into at least one first partial terahertz radiation (10a) and one second partial terahertz radiation (10b) along different optical partial axes (A1, A2),a reflection device (5) for reflecting the second partial terahertz radiation (10b) along a second optical partial axis (A2) different from the first optical partial axis (A1) of the first partial terahertz radiation (10a, 10b) and reflecting back the second partial terahertz radiation (10b), reflected from the test object (8), towards the beam splitter (4) and/or the transmitter and receiver unit (2),whereby the transmitter and receiver unit (2) generates a common measuring signal from the partial beams (10a, 10b) reflected on the test object (8) and puts it out to the controller and evaluation unit (3) for determining at least one layer thickness and/or one distance of the test object (8).