Terahertz Wave Measuring Device Spatial Resolution
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Solution Overview
Problem
Conventional terahertz wave measuring devices face challenges in achieving high spatial resolution for minute regions due to diffraction limits and are affected by absorption and reflection from complex structures, making accurate measurement complex and difficult.
Innovation Solution
A terahertz wave measuring device with a terahertz wave generation element and a structural body in close contact, where the beam diameter of the excitation light is smaller than the sample holder and the wavelength of the terahertz wave, allowing for direct measurement without absorption effects and enabling spatial resolution beyond the diffraction limit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional terahertz wave measuring device uses a light source and sample disposed separately with guided terahertz waves, then the measurement can be performed with standard components, but the spatial resolution is limited by the diffraction limit of terahertz waves
Solution Approach 1:
The patent merges the light source, terahertz wave generation element, and sample holder into a single integrated structural body. The excitation light source generates terahertz waves that directly interact with the sample without requiring separate guiding structures, thereby achieving high spatial resolution beyond the diffraction limit while maintaining device simplicity
Solution Approach 2:
The patent uses excitation light as an intermediary to generate terahertz waves at the exact location where they are needed. By condensing the excitation light to a small beam diameter and using difference frequency generation in a nonlinear optical crystal, the system achieves sub-diffraction spatial resolution without complex terahertz wave guiding structures
2Measurement precision
If a terahertz wave probe with opening size of wavelength or less is used, then spatial resolution beyond diffraction limit can be achieved, but complex structures with elements no larger than the wavelength are required
Solution Approach 1:
The patent replaces the mechanical/physical structure of a sub-wavelength opening probe with an optical field-based approach. By using condensed excitation light to generate terahertz waves directly at the measurement location, the system achieves sub-diffraction spatial resolution without requiring fabrication of complex sub-wavelength mechanical structures
Solution Approach 2:
The patent changes the operating parameters by using optical-frequency excitation light (with much smaller wavelength than terahertz waves) to generate terahertz waves. This parameter change allows the effective beam diameter to be much smaller than the terahertz wavelength, achieving high spatial resolution without sub-wavelength mechanical structures
3Measurement precision
If a near-field microscope with half mirror and complex reflection structure is used, then terahertz wave interaction with sample can be detected, but absorption and reflection from multiple interfaces require complex calculation and data processing
Solution Approach 1:
The patent extracts and eliminates the problematic half mirror and complex reflection structure from the measurement system. By using direct transmission geometry where terahertz waves generated by condensed excitation light pass through the sample to a detector, the system achieves accurate measurement without multiple interfaces that cause absorption and reflection losses
Solution Approach 2:
Instead of generating terahertz waves separately and guiding them to the sample, the patent inverts the approach by generating terahertz waves directly at the sample location using condensed excitation light. This eliminates the need for complex reflection and guiding structures, simplifying the measurement geometry while maintaining high spatial resolution
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise measurement of terahertz waves in minute regions with a simple configuration, reducing noise and absorption issues, and allowing for imaging and concentration analysis of samples.
Implementation Method 1
a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element
Data Source
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AI summary
There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.