Semiconductor Terminal Block Layout for Creepage Insulation

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Solution Overview

Problem

The conventional semiconductor apparatus experiences a decrease in insulation resistance between the terminal and the base due to peeling of the sealing material from the case's inner wall surface, leading to potential electrical failures.

Innovation Solution

The semiconductor apparatus incorporates a terminal block with a projecting portion extending at least 1 mm from the terminal's distal end, increasing the creepage distance and enhancing the adhesion of the sealing material to the case's inner wall surface.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the terminal block wall surface reaches the base immediately below the terminal distal end, then the device structure is compact, but the creepage distance is short and insulation resistance decreases when sealing material peels

Engineering Contradiction:
Improveinsulation resistanceVSAvoidcreepage distance
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

The terminal block includes a projecting portion that extends in the first direction (length dimension) from the inner wall surface beyond the terminal distal end position. This dimensional extension increases the creepage distance along the inner wall surface from the base to the terminal, providing longer insulation path without increasing vertical height or compromising compact structure.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If the terminal block wall surface reaches the base immediately below the terminal distal end, then the device structure is compact, but the sealing material adhesion is insufficient and peeling occurs

Engineering Contradiction:
Improvesealing material adhesionVSAvoidinner wall surface length
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

The projecting portion extends the inner wall surface in the length dimension, providing additional surface area for sealing material adhesion. This extended surface allows the sealing material to bond over a longer distance along the inner wall, improving adhesion strength and preventing peeling without significantly increasing the overall device footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If the terminal block is extended to increase creepage distance, then insulation resistance is maintained, but the device complexity increases

Engineering Contradiction:
Improveinsulation resistanceVSAvoidterminal block structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The projecting portion is integrated as part of the terminal block structure itself, merging the insulation extension function with the existing terminal block component. This unified design avoids adding separate insulation elements or complex structures, maintaining simplicity while achieving the required creepage distance and insulation resistance.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS12438058B2Semiconductor apparatus
Publication Date: 2025.10.07 FUJI ELECTRIC CO LTD
  • US12438058B2 patent drawing
  • US12438058B2 patent drawing
  • US12438058B2 patent drawing

AI summary

A semiconductor apparatus includes: a base, an insulating substrate arranged on the base, a semiconductor element arranged on the insulating substrate, a case joined to the base and housing the semiconductor element, and a sealing material supplied in the case. The case includes a terminal block that extends in a first direction from an inner wall surface of the case. The terminal block is arranged thereon a terminal that is electrically connected to the semiconductor element via a wiring member. The terminal block includes a projecting portion that extends, in plan view, in the first direction from a first position of a distal end portion of the terminal to a second position. A first distance between the first position and the second position is at least 1 mm.