Test Apparatus for Logic Device Delay Fault Detection
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Solution Overview
Problem
Existing methods for detecting delay faults in logic device components, such as those using double clocks, face limitations in precision and cannot distinguish between irregular operations and actual delay faults, leading to inaccurate assessments.
Innovation Solution
A test apparatus and method that sets threshold voltages for logic device components, measures operating currents at different voltage settings, and determines signal propagation path acceptability based on current differences, allowing for precise detection of delay faults.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If double clock method is used to test delay faults, then delay fault detection is enabled, but measurement precision is limited due to clock interval control constraints
Solution Approach 1:
The patent changes the operating voltage parameter of the logic device component to detect delay faults. By applying different operating voltages and measuring the resulting current consumption, the system can detect delay faults with higher precision without being constrained by clock interval control complexity. This parameter change approach transforms the detection mechanism from time-based to voltage-current based measurement.
2Reliability
If absolute delay time measurement is performed, then delay faults can be detected, but inability to distinguish between irregular operations and actual delay faults reduces reliability
Solution Approach 1:
The patent employs feedback by measuring current consumption under different operating voltage conditions and comparing the results to detect delay faults. The system applies multiple voltage levels, measures corresponding currents, and uses the relationship between voltage changes and current changes to reliably distinguish actual delay faults from irregular operations, thereby improving both reliability and measurement precision.
Solution Approach 2:
The patent changes the operating voltage parameter to multiple different voltage levels and measures the current consumption at each level. By analyzing how current consumption changes with voltage changes, the system can precisely detect delay faults and distinguish them from other irregularities, simultaneously improving reliability and measurement precision.
Data Source
AI summary
The present invention provides a test apparatus comprising: a threshold voltage setting unit for setting threshold voltages of a logic device component connected to the signal propagation path; a test signal supply unit for supplying a test signal to the test subject device so as to operate the logic device component provided to the signal propagation path in a state in which the threshold voltages have been set to first threshold voltages, and in a state in which the threshold voltages have been set to second threshold voltages, by the threshold voltage setting unit; a current measurement unit, for measuring a first operating current which is the current consumption of the test subject device in a case in which the logic device component operates in a state in which the first threshold voltages have been set, and for measuring a second operating current which is the current consumption of the test subject device in a case in which the logic device component operates in a state in which the second threshold voltages have been set; and an acceptability determination unit for determining whether or not the signal propagation path is acceptable, based upon the first operating current and the second operating current.