Test Apparatus Parallel Diagnostic Data Supply
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Solution Overview
Problem
Conventional test apparatuses require a long time to complete self-diagnosis processes for multiple test modules due to sequential diagnostic data supply, which becomes problematic with a large number of modules.
Innovation Solution
A test apparatus with a control section that supplies diagnostic data in parallel to self-diagnostic sections using the same type of data and sequentially to those with different types, allowing for efficient parallel operation and reduced overall diagnosis time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If diagnostic data is supplied sequentially to all test modules, then each test module can be diagnosed individually, but the total diagnosis time becomes excessively long
Solution Approach 1:
The patent segments test modules into multiple groups based on their diagnostic data types. Each group receives diagnostic data independently and simultaneously, allowing parallel processing. This segmentation enables the system to maintain individualized diagnosis accuracy while dramatically reducing total diagnosis time by eliminating sequential bottlenecks.
Solution Approach 2:
The control section performs preliminary classification of test modules according to their diagnostic data types before initiating the diagnosis process. By pre-organizing modules into groups with identical diagnostic requirements, the system prepares the structure for efficient parallel data supply, avoiding the need for sequential processing and reducing overall diagnosis time.
2Device complexity
If the same diagnostic data is supplied to multiple test modules, then processing can be simplified, but modules with different diagnostic requirements cannot be properly diagnosed
Solution Approach 1:
The patent applies local quality by assigning different diagnostic data types to different groups of test modules based on their specific requirements. Each group receives the appropriate diagnostic data type tailored to its needs, ensuring reliable diagnosis for each module type while maintaining a structured, manageable control system through the grouping methodology.
Data Source
AI summary
Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; and a control section that controls the plurality of test modules. Each test module includes a test section that tests the device under test; and a self-diagnostic section that diagnoses operation of the test section based on diagnostic data supplied thereto. The control section supplies the diagnostic data in parallel to self-diagnostic sections for which the same type of diagnostic data is set, and supplies the diagnostic data sequentially to self-diagnostic sections for which a different type of diagnostic data is set.