Test Apparatus Driver Circuit Segmentation for Digital Analog Signal Precision
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Solution Overview
Problem
Existing test apparatuses face challenges in achieving precision for both digital and analog test signals while maintaining a compact driver circuit size, particularly in generating high-frequency analog test signals when testing devices with both digital and analog circuits.
Innovation Solution
A test apparatus that includes a digital signal generator outputting n-bit digital test signals, driver circuits connected to digital terminals, and an analog signal generator converting the digital signals into analog test signals with a frequency corresponding to the digital signal's edge timing, allowing for high-frequency analog signal generation while sharing circuitry with digital signal processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single driver circuit is used for both digital and analog test signals, then the circuit size is reduced, but the precision for digital and analog test signals cannot be achieved
Solution Approach 1:
The driver circuit is segmented into a digital signal output section and an analog signal output section, allowing each section to be optimized for its specific signal type while sharing common circuit resources, thus achieving both precision and compact size
Solution Approach 2:
The driver circuit is designed with multi-functionality to serve both digital and analog test signal generation, enabling a single circuit to perform multiple functions without compromising the precision of either signal type
2Device complexity
If analog test signal is generated using digital test signal pattern, then circuit complexity is reduced, but high frequency analog test signal cannot be generated
Solution Approach 1:
The digital signal output section generates digital test signals at high frequencies in advance, which are then converted to analog signals, enabling the generation of high-frequency analog test signals while maintaining low circuit complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables precise testing of both digital and analog circuits with reduced circuit size, optimizing the ratio of analog to digital test signals and allowing for high-frequency analog signal output, thus overcoming the limitations of previous technologies.
Implementation Method 1
an analog signal generator that generates an analog test signal by converting, into an analog signal, an n×m-bit digital multi-bit signal
Data Source
AI summary
Provided is a test apparatus that tests a device under test, comprising a digital signal generator that outputs in parallel one or more n-bit digital test signals, where n is an integer greater than or equal to 1; a plurality of driver circuits that are connected respectively to a plurality of digital terminals of the device under test; and an analog signal generator that generates an analog test signal by converting, into an analog signal, an n×m-bit digital multi-bit signal based on the one or more digital test signals output by the digital signal generator to the plurality of driver circuits, where m is an integer greater than or equal to 2.