Multi-Control Test Apparatus for Parallel DUT Debugging
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Solution Overview
Problem
Existing test apparatuses face challenges in allowing multiple users to debug test programs simultaneously for different device under test (DUT) types, limiting parallel testing efficiency and user collaboration.
Innovation Solution
A test apparatus with multiple control apparatuses and test modules, where each control apparatus can execute a test program independently, managing and controlling testing sections allocated to different users, enabling parallel execution of test programs across various DUT types.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a single control apparatus is used to manage testing sections, then device complexity is reduced, but multiple users cannot simultaneously debug test programs for different DUT types
Solution Approach 1:
The patent divides the control function into multiple independent control apparatuses, each dedicated to a specific DUT type. Each control apparatus manages its own testing sections and executes test programs independently, enabling simultaneous multi-user debugging without requiring a single complex unified controller.
Solution Approach 2:
Each control apparatus is designed to be universal within its domain, capable of executing multiple test programs for different DUT types under its control. The control apparatuses can dynamically allocate and manage testing sections based on the specific DUT type being tested, providing flexible multi-functional capability.
2Productivity
If testing sections are allocated to specific control apparatuses, then parallel testing efficiency is improved, but resource allocation complexity increases
Solution Approach 1:
The patent segments the testing sections into distinct groups, with each control apparatus managing a specific subset of testing sections allocated to particular DUT types. This segmentation enables independent parallel execution of test programs across different control apparatuses, maximizing productivity while keeping allocation management localized and simpler.
3Loss of time
If multiple test programs are executed sequentially, then control apparatus structure remains simple, but testing time increases
Solution Approach 1:
The patent implements parallel execution by segmenting test programs across multiple control apparatuses, each executing its assigned test programs simultaneously. This segmentation eliminates sequential execution bottlenecks and reduces total testing time, while the modular control apparatus structure keeps system complexity manageable.
Solution Approach 2:
The patent transitions from sequential time-based execution to parallel space-based execution by introducing multiple control apparatuses operating simultaneously. This dimensional change from single-threaded to multi-threaded architecture enables concurrent test program execution, significantly reducing testing time loss.
Data Source
AI summary
In order to efficiently test a plurality of types of devices under test, provided is a test apparatus that tests a device under test, comprising one or more test modules that each include a plurality of testing sections testing the device under test by exchanging signals with the device under test; and a plurality of control apparatuses that control operation of the testing sections. In each of the one or more test modules, the plurality of testing sections are each allocated to one of the plurality of control apparatuses, and each of the control apparatuses is capable of executing a test program managed by a different user, and controls operation of the testing sections allocated thereto.