Test Apparatus for Liquid Drop Emission Mechanisms
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Solution Overview
Problem
Existing liquid drop emission apparatuses face challenges in downsizing due to the need for large current capacity transistors and complex wiring, limiting the ability to test multiple emission mechanisms simultaneously while performing printing tasks.
Innovation Solution
A test apparatus is designed with a series configuration of driving elements and application switches, allowing for the application of a driving voltage and a test voltage to be applied selectively to each emission mechanism, enabling failure detection through residual vibration-induced currents and voltages, and incorporating a shift register for nozzle selection data to control emission feasibility, thereby reducing circuit size and cost.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a transistor with large current capacity is used to handle currents from multiple driving elements, then the emission mechanisms can be tested, but the transistor requires independent mounting and additional space and wiring, preventing circuit downsizing
Solution Approach 1:
The invention divides the test circuit into multiple independent test circuits, each handling a subset of emission mechanisms. Each test circuit includes its own transistor (e.g., transistors 45 and 46 handle different groups of emission mechanisms separately), allowing parallel testing without requiring a single large-current transistor. This segmentation reduces the current capacity requirement for each transistor and enables circuit downsizing while maintaining test capability.
2Device complexity
If a common ground line is used to decide emission mechanism failure, then the circuit is simplified, but only one driving element can be tested at a time, reducing productivity
Solution Approach 1:
The invention segments the testing function by providing separate test circuits for different groups of emission mechanisms. Each test circuit has its own transistors and control logic, enabling simultaneous testing of multiple emission mechanisms across different circuits. This maintains circuit simplicity within each segment while achieving high productivity through parallel operation of multiple segments.
Solution Approach 2:
The invention merges multiple test circuits into a single integrated system with coordinated control. The control unit manages multiple transistors and test circuits simultaneously, combining their capabilities to achieve parallel testing of all emission mechanisms. This merging approach preserves the simplicity of individual test circuits while achieving high productivity through coordinated parallel operation.
3Productivity
If the transistor is kept on during testing, then multiple emission mechanisms can be tested simultaneously, but the transistor requires large current capacity and additional mounting space
Solution Approach 1:
The invention segments the transistor functionality across multiple smaller transistors, each handling a subset of emission mechanisms. These transistors can be kept on simultaneously during testing, enabling parallel testing capability. Each transistor's smaller current capacity requirement allows for reduced size and simplified mounting, eliminating the need for a single large-current transistor while maintaining productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution allows for efficient and simultaneous testing of multiple emission mechanisms during printing, identifying failures without disrupting the printing process, and enables a compact and cost-effective design by utilizing smaller current elements and shared control signals.
Implementation Method 1
a liquid drop emission mechanism comprising a piezoelectric element (12)
Implementation Method 2
a current flows between the both ends of the application switch in response to residual vibration of the driving element, and a test voltage appears in proportion to the current
Data Source
AI summary
A test apparatus for a liquid drop emission apparatus having a plurality of emission mechanisms, the emission mechanisms each having a driving element configured to emit an ink drop from a nozzle, and an application switch coupled with a driving voltage source and the driving element in series, the application switch being configured to switch a driving voltage for emission of a liquid drop between being applied and not being applied to the driving element, the test apparatus including a test switch configured to make each of the emission mechanisms output a test voltage which appears between both ends of the application switch to a test terminal, the test apparatus including a failure deciding section configured to decide whether the emission mechanism is in failure or not on the basis of the test voltage outputted to the test terminal.