Test Apparatus Signal Superposition for High Frequency Generation
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Solution Overview
Problem
Conventional test apparatuses are limited in generating test signals of higher frequencies due to the restriction of the number of pattern generating circuits that can be connected to a waveform shaper and driver, which restricts the maximum frequency of test signals that can be inputted to a device under test.
Innovation Solution
A test apparatus and performance board configuration that includes multiple signal supply sections and connection sections to superpose test signals from individual wiring lines, allowing for the input of test signals at different timings and frequencies beyond the limitations of individual pins, enabling the generation of higher frequency test signals by connecting multiple pattern generating circuits and drivers to a shared input terminal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If multiple pattern generating circuits are connected to a waveform shaper to generate higher frequency test signals, then the maximum test signal frequency increases, but the device complexity increases due to the limited number of connections possible
Solution Approach 1:
The patent divides the signal generation system into multiple independent pattern generating circuits that operate in parallel, each capable of generating test signals at different timings. This segmentation allows the system to overcome the limitation of connecting multiple circuits to a single waveform shaper by distributing the signal generation functions across multiple independent units that can be connected through a shared connection structure.
Solution Approach 2:
The patent merges the output signals from multiple pattern generating circuits and drivers by connecting them to a shared waveform shaper input terminal. This combining approach allows multiple signal sources to be integrated into a single waveform shaper, enabling the generation of higher frequency test signals without requiring separate waveform shapers for each circuit, thus reducing overall device complexity.
2Speed
If more pattern generating circuits are connected to generate faster test signals, then the test signal frequency increases, but the number of waveform shapers required increases beyond the number of available pins
Solution Approach 1:
The patent implements a universal connection structure where a single waveform shaper can receive and process signals from multiple pattern generating circuits through shared input terminals. This multi-functional design allows the waveform shaper to serve multiple signal sources simultaneously, eliminating the need for separate waveform shapers for each pattern generating circuit and thereby increasing the system's adaptability.
Solution Approach 2:
The patent resolves the connection limitation by transitioning from a one-to-one connection model to a many-to-one connection model, utilizing temporal dimensionality through interleave techniques. Multiple pattern generating circuits operate at different timings in a time-division manner, allowing their signals to be multiplexed onto a single waveform shaper input, thus overcoming the physical pin limitation.
3Speed
If multiple drivers are used to increase test signal frequency, then the maximum frequency increases, but the driver operating frequency becomes a limiting factor
Solution Approach 1:
The patent employs periodic action by having multiple drivers output test signals at different timing periods. Each driver operates at its reliable maximum frequency, but the combined output through the waveform shaper creates a higher frequency test signal. This periodic staggering of signal outputs allows the system to achieve higher effective frequency while maintaining the reliability of individual driver operations.
Solution Approach 2:
The patent ensures continuity of useful action by maintaining continuous signal generation from multiple drivers operating at different timings. The waveform shaper continuously processes and combines these signals without interruption, creating a continuous high-frequency test signal output. This continuous operation eliminates dead time between signal generations and maintains reliable testing capability at higher frequencies.
Data Source
AI summary
Provided is a test apparatus for testing a device under test, including: a plurality of signal supply sections that output test signals at different timing from each other; and a connection section that connects lines of wiring transmitting the test signals respectively outputted from the signal supply sections with each other, connects the lines of wiring to an input terminal of the device under test, and inputs the test signals to the input terminal after superposing the test signals. The connection section may include a performance board to which the device under test is mounted, where the lines of wiring are connected with each other on the performance board.